Microchip Technology AC164345 Data Sheet
Development Systems Ordering Guide
DS30177T-page 88
© 2005 Microchip Technology Inc.
SEEVAL
®
32 Serial EEPROM Evaluation System
Designer’s Kit
Microchip’s
SEEVAL 32
Serial EEPROM
Evaluation System
Designer’s Kit
supports all
Microchip serial
EEPROMs,
including future
devices. Through
the use of a ZIF
SEEVAL 32
Serial EEPROM
Evaluation System
Designer’s Kit
supports all
Microchip serial
EEPROMs,
including future
devices. Through
the use of a ZIF
socket, standard DIP packages are directly supported.
The 8-lead SOIC, TSSOP, MSOP, DFN and 5-lead
SOT-23 packages can also be supported by using
separate third party adapters. The SEEVAL 32
Evaluation System gives the designer or system
integrator the ability to read, write, or erase any byte,
page, or the entire array, and to display, save, or load
this data as a file. The SEEVAL 32 Evaluation System
and its host software and firmware capabilities provide
support for all the current Windows operating systems,
including: Windows XP, Windows ME, Windows 2000,
Windows NT
The 8-lead SOIC, TSSOP, MSOP, DFN and 5-lead
SOT-23 packages can also be supported by using
separate third party adapters. The SEEVAL 32
Evaluation System gives the designer or system
integrator the ability to read, write, or erase any byte,
page, or the entire array, and to display, save, or load
this data as a file. The SEEVAL 32 Evaluation System
and its host software and firmware capabilities provide
support for all the current Windows operating systems,
including: Windows XP, Windows ME, Windows 2000,
Windows NT
®
4.0 and also Windows 95/98.
The SEEVAL 32 Evaluation System provides advanced
features to aid in system integration and debug.
Through the use of test pins on the system, an
oscilloscope or other test equipment can be easily
connected to evaluate timing and voltage levels.
Through the SEEVAL 32 Evaluation System host
software, serial EEPROMs can be tested by reading
and writing data in the EEPROM under test and by
evaluating checksum data. Erase/write endurance can
also be measured by selecting a Continuous Loop
mode to repeatedly read/write/erase the EEPROM.
features to aid in system integration and debug.
Through the use of test pins on the system, an
oscilloscope or other test equipment can be easily
connected to evaluate timing and voltage levels.
Through the SEEVAL 32 Evaluation System host
software, serial EEPROMs can be tested by reading
and writing data in the EEPROM under test and by
evaluating checksum data. Erase/write endurance can
also be measured by selecting a Continuous Loop
mode to repeatedly read/write/erase the EEPROM.
The SEEVAL 32 Serial EEPROM Evaluation System
Designer’s Kit also includes the Total Endurance™
Software Model, a powerful tool which can predict the
erase/write endurance of any given serial EEPROM
based upon its application parameters: temperature,
voltage, cycles per day and bytes per cycle.
Designer’s Kit also includes the Total Endurance™
Software Model, a powerful tool which can predict the
erase/write endurance of any given serial EEPROM
based upon its application parameters: temperature,
voltage, cycles per day and bytes per cycle.
SEEVAL
®
32 Serial EEPROM Evaluation System
Designer’s Kit Contents
• Total Endurance Software Model
• SEEVAL 32 Evaluation System
• Serial EEPROM Sample Pack
• SEEVAL 32 Evaluation System Software
• RS-232 Interface Cable
• Power Supply
Ordering Information:
DV243002
SEEVAL
®
32 Serial EEPROM Evaluation System Designer’s Kit