Microchip Technology AC164340 Data Sheet

DS30177T-page 28

© 2005 Microchip Technology Inc.

Microchip’s revolutionary Total Endurance Software 
Model provides electronic system designers with 
unprecedented visibility into serial EEPROM-based 
applications. This advanced software model (with a 
very friendly user interface) eliminates time and 
guesswork from serial EEPROM-based designs by 
accurately predicting the device’s performance and 
reliability within a user-defined application 
environment. Design trade-off analysis, which formerly 
consumed days or weeks, can now be performed in 
minutes – with a level of accuracy that delivers a truly 
robust design.

With Microchip’s Total Endurance Software Model, 
users may input the following application parameters:

• Serial EEPROM device type

• Bytes to be written per cycle

• Cycling mode – byte or page

• Data pattern type – random or worst-case

• Temperature in °C

• Erase/Write cycles per day

• Application lifetime or target PPM level

The model will respond with FIT rate, PPM level, 
application life and plot of the PPM level versus 
number of cycles. The model is available in both 
MS-DOS

®

 and Windows

®

 versions.

• Automatic or manual recalculation

• Real-time update of data

• Full screen or windowed graphical view

• Hypertext on-screen help

• Key or slide bar entry of parameters

• On-screen editing of parameters

• Single click copy of plot to clipboard

• Numeric export to delimited text file

• On-disk Total Endurance tutorial

Free download: www.microchip.com