Microchip Technology AC164322 Data Sheet

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DS30177T-page ii
© 2005 Microchip Technology Inc.
Information contained in this publication regarding device
applications and the like is provided only for your convenience
and may be superseded by updates. It is your responsibility to
ensure that your application meets with your specifications.
MICROCHIP MAKES NO REPRESENTATIONS OR WAR-
RANTIES OF ANY KIND WHETHER EXPRESS OR IMPLIED,
WRITTEN OR ORAL, STATUTORY OR OTHERWISE,
RELATED TO THE INFORMATION, INCLUDING BUT NOT
LIMITED TO ITS CONDITION, QUALITY, PERFORMANCE,
MERCHANTABILITY OR FITNESS FOR PURPOSE.
Microchip disclaims all liability arising from this information and
its use. Use of Microchip’s products as critical components in
life support systems is not authorized except with express
written approval by Microchip. No licenses are conveyed,
implicitly or otherwise, under any Microchip intellectual property
rights.
Trademarks
The Microchip name and logo, the Microchip logo, Accuron, 
dsPIC, K
EE
L
OQ
, microID, MPLAB, PIC, PICmicro, PICSTART, 
PRO MATE, PowerSmart, rfPIC, and SmartShunt are 
registered trademarks of Microchip Technology Incorporated 
in the U.S.A. and other countries.
AmpLab, FilterLab, Migratable Memory, MXDEV, MXLAB, 
PICMASTER, SEEVAL, SmartSensor and The Embedded 
Control Solutions Company are registered trademarks of 
Microchip Technology Incorporated in the U.S.A.
Analog-for-the-Digital Age, Application Maestro, dsPICDEM, 
dsPICDEM.net, dsPICworks, ECAN, ECONOMONITOR, 
FanSense, FlexROM, fuzzyLAB, In-Circuit Serial 
Programming, ICSP, ICEPIC, Linear Active Thermistor, 
MPASM, MPLIB, MPLINK, MPSIM, PICkit, PICDEM, 
PICDEM.net, PICLAB, PICtail, PowerCal, PowerInfo, 
PowerMate, PowerTool, rfLAB, rfPICDEM, Select Mode, 
Smart Serial, SmartTel, Total Endurance and WiperLock are 
trademarks of Microchip Technology Incorporated in the 
U.S.A. and other countries.
SQTP is a service mark of Microchip Technology Incorporated 
in the U.S.A.
All other trademarks mentioned herein are property of their 
respective companies.
© 2005, Microchip Technology Incorporated, Printed in the 
U.S.A., All Rights Reserved.
 Printed on recycled paper.
Note the following details of the code protection feature on Microchip devices:
Microchip products meet the specification contained in their particular Microchip Data Sheet.
Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the 
intended manner and under normal conditions.
There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our 
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data 
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
Microchip is willing to work with the customer who is concerned about the integrity of their code.
Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not 
mean that we are guaranteeing the product as “unbreakable.”
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our
products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts
allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.
Microchip received ISO/TS-16949:2002 quality system certification for 
its worldwide headquarters, design and wafer fabrication facilities in 
Chandler and Tempe, Arizona and Mountain View, California in 
October 2003. The Company’s quality system processes and 
procedures are for its PICmicro
®
 
8-bit MCUs, K
EE
L
OQ
®
 
code hopping 
devices, Serial EEPROMs, microperipherals, nonvolatile memory and 
analog products. In addition, Microchip’s quality system for the design 
and manufacture of development systems is ISO 9001:2000 certified.