Microchip Technology DV320032 Data Sheet
PIC32MX330/350/370/430/450/470
DS60001185C-page 304
2012-2013 Microchip Technology Inc.
TABLE 30-34: ADC MODULE SPECIFICATIONS
AC CHARACTERISTICS
(5)
Standard Operating Conditions: 2.5V to 3.6V
(unless otherwise stated)
Operating temperature
(unless otherwise stated)
Operating temperature
-40°C
T
A
+85°C for Industrial
-40°C
T
A
+105°C for V-temp
Param.
No.
Symbol
Characteristics
Min.
Typical
Max.
Units
Conditions
Device Supply
AD01
AD01
AV
DD
Module V
DD
Supply
Greater of
V
DD
– 0.3
or 2.5
—
Lesser of
V
DD
+ 0.3
or 3.6
V
—
AD02
AV
SS
Module V
SS
Supply
V
SS
—
V
SS
+ 0.3
V
—
Reference Inputs
AD05
AD05
V
REFH
Reference Voltage High AV
SS
+ 2.0
—
AV
DD
V
(Note 1)
AD05a
2.5
—
3.6
V
V
REFH
= AV
DD
(Note 3)
AD06
V
REFL
Reference Voltage Low
AV
SS
—
V
REFH
–
2.0
V
(Note 1)
AD07
V
REF
Absolute Reference
Voltage (V
Voltage (V
REFH
– V
REFL
)
2.0
—
AV
DD
V
(Note 3)
AD08
I
REF
Current Drain
—
250
—
400
3
A
A
A
ADC operating
ADC off
Analog Input
AD12
AD12
V
INH
-V
INL
Full-Scale Input Span
V
REFL
—
V
REFH
V
—
AD13
V
INL
Absolute V
INL
Input
Voltage
AV
SS
– 0.3
—
AV
DD
/2
V
—
AD14
V
IN
Absolute Input Voltage
AV
SS
– 0.3
—
AV
DD
+ 0.3
V
—
AD15
Leakage Current
—
+/- 0.001
+/-0.610
A V
INL
= AV
SS
= V
REFL
= 0V,
AV
DD
= V
REFH
= 3.3V
Source Impedance = 10 k
AD17
R
IN
Recommended
Impedance of Analog
Voltage Source
Impedance of Analog
Voltage Source
—
—
5K
(Note 1)
ADC Accuracy – Measurements with External V
REF
+/V
REF
-
AD20c Nr
Resolution
10 data bits
bits
—
AD21c INL
Integral Nonlinearity
> -1
—
< 1
LSb V
INL
= AV
SS
= V
REFL
= 0V,
AV
DD
= V
REFH
= 3.3V
AD22c DNL
Differential Nonlinearity
> -1
—
< 1
LSb V
INL
= AV
SS
= V
REFL
= 0V,
AV
DD
= V
REFH
= 3.3V
(Note 2)
AD23c G
ERR
Gain Error
> -1
—
< 1
LSb V
INL
= AV
SS
= V
REFL
= 0V,
AV
DD
= V
REFH
= 3.3V
AD24n E
OFF
Offset Error
> -1
—
< 1
LSb V
INL
= AV
SS
= 0V,
AV
DD
= 3.3V
AD25c
—
Monotonicity
—
—
—
—
Guaranteed
Note 1: These parameters are not characterized or tested in manufacturing.
2: With no missing codes.
3: These parameters are characterized, but not tested in manufacturing.
4: Characterized with a 1 kHz sine wave.
5: Overall functional device operation at V
3: These parameters are characterized, but not tested in manufacturing.
4: Characterized with a 1 kHz sine wave.
5: Overall functional device operation at V
BORMIN
< V
DD
< V
DDMIN
is tested, but not characterized. All device
Analog modules, such as ADC, etc., will function, but with degraded performance below V
DDMIN
. Refer to
BORMIN
values.