Freescale Semiconductor Evaluation Kit (EVK) for the i.MX51 Applications Processor MCIMX51LCD MCIMX51LCD Data Sheet
Product codes
MCIMX51LCD
i.MX51 Applications Processors for Consumer and Industrial Products, Rev. 6
132
Freescale Semiconductor
Electrical Characteristics
Figure 90. Test Access Port Timing Diagram
Figure 91. TRST Timing Diagram
Table 99. JTAG Timing
ID
Parameter
1,2
All Frequencies
Unit
Min
Max
SJ0
TCK frequency of operation 1/(3•T
DC
)
1
0.001
22
MHz
SJ1
TCK cycle time in crystal mode
45
—
ns
SJ2
TCK clock pulse width measured at
V
M
2
22.5
—
ns
SJ3
TCK rise and fall times
—
3
ns
SJ4
Boundary scan input data set-up time
5
—
ns
SJ5
Boundary scan input data hold time
24
—
ns
SJ6
TCK low to output data valid
—
40
ns
SJ7
TCK low to output high impedance
—
40
ns
SJ8
TMS, TDI data set-up time
5
—
ns
TCK
(Input)
TDI
(Input)
TDO
(Output)
TDO
(Output)
TDO
(Output)
VIH
VIL
Input Data Valid
Output Data Valid
Output Data Valid
TMS
SJ8
SJ9
SJ10
SJ11
SJ10
TCK
(Input)
TRST
(Input)
SJ13
SJ12