Freescale Semiconductor Eval, Demo and Development Board for MCF51MM256 TWR-MCF51MM TWR-MCF51MM Data Sheet

Product codes
TWR-MCF51MM
Page of 57
Electrical Characteristics
Freescale Semiconductor
37
3.10 MCG and External Oscillator (XOSC) Characteristics
 
Table 18. MCG (Temperature Range = –40 to 105
°
C Ambient) 
#
Rating
Symbol
Min
Typical
Max
Unit
C
1 Internal reference startup time
t
irefst
55
100
s
D
2
Average internal reference 
frequency
factory trimmed at 
VDD=3.0 V and 
temp=25C
f
int_ft
31.25
kHz
C
user trimmed
31.25
39.0625
C
3
DCO output frequency range — 
trimmed
Low range 
(DRS=00)
f
dco_t
16
20
MHz
C
Mid range 
(DRS=01)
32
40
C
High range
1
 
(DRS=10)
1
This should not exceed the maximum CPU frequency for this device which is 50.33 MHz. 
40
60
C
4
Resolution of trimmed DCO 
output frequency at fixed voltage 
and temperature
with FTRIM
f
dco_res_t
0.1
0.2
%f
dco
C
without FTRIM
0.2
0.4
C
5
Total deviation of trimmed DCO 
output frequency over voltage and 
temperature 
over voltage and 
temperature
f
dco_t
1.0 
2
%f
dco
P
over fixed voltage 
and temp range 
of 0 – 70 C
0.5
1
C
6
Acquisition time 
 
FLL
2
t
fll_acquire
1
ms
C
PLL
3
 
t
pll_acquire
1
D
7
Long term Jitter of DCO output clock (averaged over 
2mS interval) 
4
C
Jitter
0.02
0.2
%f
dco
C
8 VCO operating frequency
f
vco
7.0
55.0
MHz
D
9 PLL reference frequency range
f
pll_ref
1.0
2.0
MHz
D
10
Jitter of PLL output clock 
measured over 625ns 
5
Long term 
f
pll_jitter_625
ns
0.566
4
%f
pll
D
11 Lock frequency tolerance 
Entry
6
D
lock
1.49
2.98
%
D
Exit
7
D
unl
4.47
5.97
D
12 Lock time
FLL
t
fll_lock
t
fll_acquire+ 
1075(1/
f
int_t)
s
D
PLL
t
pll_lock
t
pll_acquire+ 
1075(1/
f
pll_re
f)
D
13
Loss of external clock minimum frequency - RANGE = 
0
f
loc_low
(3/5) x 
f
int_t
kHz
D
14
Loss of external clock minimum frequency - RANGE = 
1
f
loc_high
(16/5) x 
f
int_t
kHz
D
MCF51MM256/128, Rev. 5