Intel 2.80 GHz BX80546KG2800EA Data Sheet
Product codes
BX80546KG2800EA
Intel® Xeon™ Processor with 800 MHz System Bus
28
Datasheet
NOTES:
1. V
OS
is measured overshoot voltage.
2. T
OS
is measured time duration above VID.
2.11.3
Die Voltage Validation
Overshoot events from application testing on processor must meet the specifications in
when measured across the VCCSENSE and VSSSENSE pins. Overshoot events that are < 10 ns in
duration may be ignored. These measurement of processor die level overshoot should be taken with
a 100 MHz bandwidth limited oscilloscope.
duration may be ignored. These measurement of processor die level overshoot should be taken with
a 100 MHz bandwidth limited oscilloscope.
NOTES:
1. Unless otherwise noted, all specifications in this table apply to all processor frequencies.
2. These parameters are based on design characterization and are not tested.
3. Leakage to V
2. These parameters are based on design characterization and are not tested.
3. Leakage to V
SS
with pin held at V
TT
Figure 5.
V
CC
Overshoot Example Waveform
0
5
10
15
20
25
Time [us]
Volta
g
e
[V]
VID - 0.000
VID + 0.050
V
OS
T
OS
T
OS
: Overshoot time above VID
V
OS
: Overshoot above VID
Table 12.
BSEL[1:0] and VID[5:0] Signal Group DC Specifications
Symbol
Parameter
Min
Typ
Max
Units
Notes
1
R
ON
BSEL[1:0] and VID[5:0]
Buffer On Resistance
Buffer On Resistance
N/A
60
W
2
I
OL
Maximum Pin Current
N/A
8
mA
2
I
LO
Output Leakage Current
N/A
200
µA
2,3
R
PULL_UP
Pull-Up Resistor
500
W
V
TOL
Voltage Tolerance
0.95 * V
TT
V
TT
1.05 * V
TT
V