Intel Core 2 Duo E7300 BX80570E7300 User Manual

Product codes
BX80570E7300
Page of 128
 
Balanced Technology Extended (BTX) Thermal/Mechanical Design Information 
 
 
Thermal and Mechanical Design Guidelines   
 47 
5.2.1.2.1  Recommended Test Sequence 
Each test sequence should start with components (i.e., motherboard, heatsink 
assembly, etc.) that have never been previously submitted to any reliability testing.  
The test sequence should always start with a visual inspection after assembly, and 
BIOS/CPU/Memory test (refer to Section 
Prior to the mechanical shock & vibration test, the units under test should be 
preconditioned for 72 hours at 45º C. The purpose is to account for load relaxation 
during burn-in stage. 
The stress test should be followed by a visual inspection and then BIOS/CPU/Memory 
test. 
5.2.1.2.2  Post-Test Pass Criteria 
The post-test pass criteria are: 
1.  No significant physical damage to the heatsink attach mechanism (including such 
items as clip and motherboard fasteners). 
2.  Heatsink must remain attached to the motherboard.  
3.  Heatsink remains seated and its bottom remains mated flatly against IHS surface. 
No visible gap between the heatsink base and processor IHS. No visible tilt of the 
heatsink with respect to its attach mechanism. 
4.  No signs of physical damage on motherboard surface due to impact of heatsink or 
heatsink attach mechanism. 
5.  No visible physical damage to the processor package. 
6.  Successful BIOS/Processor/memory test of post-test samples. 
7.  Thermal compliance testing to demonstrate that the case temperature 
specification can be met. 
5.2.2 
Power Cycling 
Thermal performance degradation due to TIM degradation is evaluated using power 
cycling testing. The test is defined by 7500 cycles for the case temperature from room 
temperature (~23º C) to the maximum case temperature defined by the thermal 
profile at TDP. A Thermal Test Vehicle is used for this test.