Intel Core 2 Duo E7300 BX80570E7300 User Manual

Product codes
BX80570E7300
Page of 128
 
ATX Thermal/Mechanical Design Information 
 
 
Thermal and Mechanical Design Guidelines   
 57 
6.2.4 
Heatsink Thermal Validation 
Intel recommends evaluation of the heatsink within the specific boundary conditions 
based on the methodology described Section 
6.3 , and using a thermal test vehicle.  
Testing is done on bench top test boards at ambient lab temperature. In particular, for 
the reference heatsink, the Plexiglas* barrier is installed 81.28 mm [3.2 in] above the 
motherboard (refer to Sections 
The test results, for a number of samples, are reported in terms of a worst-case mean 
+ 3 value for thermal characterization parameter using real processors (based on the 
thermal test vehicle correction factors).  
Note:  The above 81.28 mm obstruction height that is used for testing complies with the 
recommended obstruction height of 88.9 mm for the ATX form factor. However, it 
would conflict with systems in strict compliance with the ATX specification which 
allows an obstruction as low as 76.2 mm above the motherboard surface in Area A.  
6.3 
Environmental Reliability Testing 
6.3.1 
Structural Reliability Testing 
Structural reliability tests consist of unpackaged, board-level vibration and shock tests 
of a given thermal solution in the assembled state. The thermal solution should meet 
the specified thermal performance targets after these tests are conducted; however, 
the test conditions outlined here may differ from your own system requirements. 
6.3.1.1 
Random Vibration Test Procedure 
Duration: 10 min/axis, 3 axes 
Frequency Range: 5 Hz to 500 Hz  
Power Spectral Density (PSD) Profile: 3.13 G RMS