Toshiba A40 User Manual
3 Tests and Diagnostics
3.3 Subtest Names
3.3 Subtest
Names
Table 3-1 lists the subtest names for each test program in the DIAGNOSTIC TEST MENU.
Table 3-1 Subtest names (1/2)
No.
Test Name
Subtest No.
Subtest Name
1 SYSTEM
01
02
04
06
07
08
09
02
04
06
07
08
09
ROM checksum
Geyserville
Fan ON/OFF
Quick charge
DMI read
DMI write
Thermister check
Geyserville
Fan ON/OFF
Quick charge
DMI read
DMI write
Thermister check
2 MEMORY
01
02
06
02
06
Conventional memory
Protected mode
Stress
Protected mode
Stress
3 KEYBOARD
01
02
04
05
06
07
02
04
05
06
07
Pressed key display
Pressed key code display
Touch pad
USB (Port 0, Port 1) test
USB (Port 2, Port 3) test
CD-function key test
Pressed key code display
Touch pad
USB (Port 0, Port 1) test
USB (Port 2, Port 3) test
CD-function key test
4 DISPLAY
01
02
03
04
05
06
07
02
03
04
05
06
07
VRAM read/write for VGA
Gradation for VGA
Gradation for LCD
Gradation & mode test for VGA
All dot on/off for LCD
“H” pattern display
LCD brightness
Gradation for VGA
Gradation for LCD
Gradation & mode test for VGA
All dot on/off for LCD
“H” pattern display
LCD brightness
5 FLOPPY
DISK
01
02
03
04
05
02
03
04
05
Sequential read
Sequential read/write
Random address/data
Write specified address
Read specified address
Sequential read/write
Random address/data
Write specified address
Read specified address
3-8
Satellite A40 Maintenance Manual (960-458)