VXi VX1410A User Manual
VX1410A & VX1420A IntelliFrame Mainframe Instruction Manual
3–149
TEST Subsystem
This section describes each command and query in the TEST subsystem. These
commands are used to execute internal self tests. The TEST subsystem controls
the parameters shown in Figure 3–9.
commands are used to execute internal self tests. The TEST subsystem controls
the parameters shown in Figure 3–9.
Figure 3–9: TEST subsystem hierarchy
Table 3–19 lists all of the internal self tests of the IntelliFrame Mainframe.
Table 3–19: IntelliFrame Mainframeself test
Test number
Test name
Execution time
(seconds)
(seconds)
Power on test
Included in
TEST?
TEST?
Invoked by
TEST:NUMBer?
TEST:NUMBer?
1000
Fan Speed Control
116
No
Yes
Yes
1010
ADC and DAC Control
< 1
Yes
Yes
Yes
1100
Front Panel Display Control Test 1
25
No
No
Yes
1110
Front Panel Display Control Test 2
36
No
No
Yes
1120
Front Panel Display Control Test 3
6
No
No
Yes
A description of each self test is listed below:
H Fan Speed Control test. This test varies the fan speed control and verifies
that the fan speed changes accordingly.
H ADC and DAC Control test. This test verifies the internal ADC and DAC
circuitry.
H Front Panel Display Control Test 1. This test performs the following
sequences:
a. Turns on all display pixels.
b. Turns off all display pixels.
c.
Writes the character 8 to each display position.
d. Turns on all display pixels.