User ManualTable of Contents1.0 General Description52.0 Mechanical Specification62.1 Physical dimensions and Weight63.0 Product Specifications73.1 System Interface and Configuration73.2 System Performance73.3 Drive Capacity73.4 Supply Voltage73.5 System Power Consumption73.6 System Reliability83.7 Environmental Specifications84.0 Electrical Interface Specification84.1 Serial ATA Interface connector84.2 Pin Assignments95.0 Frame Information Structure (FIS)105.1 Register - Host to Device105.2 Register - Device to Host115.3 Data125.4 PIO Setup125.5 DMA Activate - Device to Host135.6 DMA Setup135.7 Set Device Bits - Device to Host136.0 Shadow Register Block registers Description146.1 Command Register146.2 Device Control Register146.2.1 Field / bit description146.3 Device / Head Register146.3.1 Field / bit description146.4 Error Register146.4.1 Field / bit description146.5 Features Register156.6 Cylinder High (LBA High) Register156.7 Cylinder Low (LBA Mid) Register156.8 Sector Number (LBA low) Register156.9 Sector Count Register156.10 Status Register156.10.1 Field / bit description157.0 Command Descriptions167.1 Supported ATA Commands167.2 SECURITY FEATURE Set177.2.1 SECURITY mode default setting177.2.2 Initial setting of the user password177.2.3 SECURITY mode operation from power-on177.2.4 Password lost177.3 SMART FEATURE Set (B0h)177.3.1 Sub Command177.3.1.1 S.M.A.R.T. Read Attribute Values (subcommand D0h)177.3.1.2 S.M.A.R.T. Read Attribute Thresholds (subcommand D1h)187.3.1.3 S.M.A.R.T. Enable/Disable Attribute Autosave (subcommand D2h)187.3.1.4 S.M.A.R.T. Save Attribute Values (subcommand D3h)187.3.1.5 S.M.A.R.T. Execute Off-line Immediate (subcommand D4h)187.3.1.6 S.M.A.R.T. Selective self-test routine197.3.1.7 S.M.A.R.T. Read Log Sector (subcommand D5h)207.3.1.8 S.M.A.R.T. Write Log Sector (subcommand D6h)207.3.1.9 S.M.A.R.T. Enable Operations (subcommand D8h)207.3.1.10 S.M.A.R.T. Disable Operations (subcommand D9h)207.3.1.11 S.M.A.R.T. Return Status (subcommand DAh)217.3.1.12 S.M.A.R.T. Enable/Disable Automatic Off-line (subcommand DBh)217.3.2 Device Attribute Data Structure227.3.2.1 Data Structure Revision Number227.3.2.2 Individual Attribute Data Structure237.3.2.3 Off-Line Data Collection Status247.3.2.4 Self-test execution status247.3.2.5 Total time in seconds to complete off-line data collection activity247.3.2.6 Current segment pointer247.3.2.7 Off-line data collection capability247.3.2.8 S.M.A.R.T. Capability257.3.2.9 Error logging capability257.3.2.10 Self-test failure check point257.3.2.11 Self-test completion time257.3.2.12 Data Structure Checksum257.3.3 Device Attribute Thresholds data structure257.3.3.1 Data Structure Revision Number257.3.3.2 Individual Thresholds Data Structure267.3.3.3 Attribute ID Numbers267.3.3.4 Attribute Threshold267.3.3.5 Data Structure Checksum267.3.4 S.M.A.R.T. Log Directory267.3.5 S.M.A.R.T. error log sector277.3.5.1 S.M.A.R.T. error log version277.3.5.2 Error log pointer277.3.5.3 Device error count277.3.5.4 Error log data structure277.3.5.5 Command data structure287.3.5.6 Error data structure297.3.6 Self-test log structure307.3.7 Selective self-test log data structure307.3.8 Error reporting318.0 OOB signaling and Phy Power State318.1 OOB signaling318.1.1 OOB signal spacing318.2 Phy Power State328.2.1 COMRESET sequence state diagram328.2.2 Interface Power States328.2.2.1 PHYRDY328.2.2.2 Partial328.2.2.3 Slumber328.2.3 Partial/Slumber to PHYRDY328.2.3.1 Host Initiated328.2.3.2 Device Initiated328.2.4 PHYRDY to Partial/Slumber338.2.4.1 Host Initiated for Partial338.2.4.2 Device Initiated for Partial339.0 SATA II Optional Feature349.1 Asynchronous Signal Recovery3410.0 Identify Device Data3511.0 Ordering Information3712.0 Product Line up37Size: 1.72 MBPages: 37Language: EnglishOpen manual