Hitachi HCS721025CLA382 Manual De Usuario
Hitachi hard disk drive specifications
150
11.18.2.4
Device error count
This field shall contain the total number of errors attributable to the device that have been reported by the device
during the life of the device. This count shall not include errors attributed to the receipt of faulty commands such
as commands codes not implemented by the device or requests with invalid parameters or invalid addresses. If
the maximum value for this field is reached the count shall remain at the maximum value when additional errors
are encountered and logged.
during the life of the device. This count shall not include errors attributed to the receipt of faulty commands such
as commands codes not implemented by the device or requests with invalid parameters or invalid addresses. If
the maximum value for this field is reached the count shall remain at the maximum value when additional errors
are encountered and logged.
11.18.3 Extended Self-test log sector
Table 106 defines the format of each of the sectors that comprise the Extended SMART self-test log.
The Extended SMART self-test log sector shall support 48-bit and 28-bit addressing. All 28-bit entries contained
in the SMART self-test log, defined in 7.42.6,
in the SMART self-test log, defined in 7.42.6,
“Self-test log data structure" on page 219 shall also be included in
the Extended SMART self-test log with all 48-bit entries.
Description
Bytes
Offset
Self-test log data structure revision number
1
00h
Reserved
1
01h
Self-test descriptor index (7:0)
1
02h
Self-test descriptor index (15:8)
1
03h
Descriptor entry 1
26
04h
Descriptor entry 2
26
1Eh
...
Descriptor entry 18
26
1D8h
Vendor specific
2
1F2h
Reserved
11
1F4h
Data structure checksum
1
1FFh
512
Table 106 Extended Self-test log data structure
These descriptor entries are viewed as a circular buffer. The nineteenth self-test shall create a descriptor entry
that replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that replaces
descriptor entry 2, etc. All unused self-test descriptors shall be filled with zeros.
that replaces descriptor entry 1. The next self-test after that shall create a descriptor entry that replaces
descriptor entry 2, etc. All unused self-test descriptors shall be filled with zeros.
11.18.3.1
Self-test log data structure revision number
The value of this revision number shall be 01h.
11.18.3.2
Self-test descriptor index
This indicates the most recent self-test descriptor. If there have been no self-tests, this is set to zero. Valid
values for the Self-test descriptor index are 0 to 18.
values for the Self-test descriptor index are 0 to 18.