Cypress STK12C68-5 Manual De Usuario
STK12C68-5 (SMD5962-94599)
Document Number: 001-51026 Rev. **
Page 8 of 18
Data Retention and Endurance
Parameter
Description
Min
Unit
DATA
R
Data Retention
100
Years
NV
C
Nonvolatile STORE Operations
1,000
K
Capacitance
In the following table, the capacitance parameters are listed.
Parameter
Description
Test Conditions
Max
Unit
C
IN
Input Capacitance
T
A
= 25
°C, f = 1 MHz,
V
CC
= 0 to 3.0 V
8
pF
C
OUT
Output Capacitance
7
pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
Parameter
Description
Test Conditions
28-CDIP 28-LCC
Unit
Θ
JA
Thermal Resistance
(Junction to Ambient)
(Junction to Ambient)
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per
EIA / JESD51.
procedures for measuring thermal impedance, per
EIA / JESD51.
TBD
TBD
°C/W
Θ
JC
Thermal Resistance
(Junction to Case)
(Junction to Case)
TBD
TBD
°C/W
Figure 7. AC Test Loads
AC Test Conditions
5.0V
Output
30 pF
R1 963
Ω
R2
512
Ω
5.0V
Output
5 pF
R1 963
Ω
R2
512
Ω
For Tri-state Specs
Input Pulse Levels .................................................... 0V to 3V
Input Rise and Fall Times (10% to 90%) ...................... <5 ns
Input and Output Timing Reference Levels .......................1.5
Input Rise and Fall Times (10% to 90%) ...................... <5 ns
Input and Output Timing Reference Levels .......................1.5
Note
6. These parameters are guaranteed by design and are not tested.