Cypress CY7C1157V18 Manual De Usuario
CY7C1146V18, CY7C1157V18
CY7C1148V18, CY7C1150V18
CY7C1148V18, CY7C1150V18
Document Number: 001-06621 Rev. *D
Page 13 of 27
IDCODE
The IDCODE instruction causes a vendor-specific, 32-bit code
to be loaded into the instruction register. It also places the
instruction register between the TDI and TDO pins and enables
the IDCODE to be shifted out of the device when the TAP
controller enters the Shift-DR state. The IDCODE instruction is
loaded into the instruction register upon power up or whenever
the TAP controller is supplied a test logic reset state.
to be loaded into the instruction register. It also places the
instruction register between the TDI and TDO pins and enables
the IDCODE to be shifted out of the device when the TAP
controller enters the Shift-DR state. The IDCODE instruction is
loaded into the instruction register upon power up or whenever
the TAP controller is supplied a test logic reset state.
SAMPLE Z
The SAMPLE Z instruction causes the boundary scan register to
be connected between the TDI and TDO pins when the TAP
controller is in a Shift-DR state. The SAMPLE Z command puts
the output bus into a High-Z state until the next command is
supplied when the Update IR state is active.
be connected between the TDI and TDO pins when the TAP
controller is in a Shift-DR state. The SAMPLE Z command puts
the output bus into a High-Z state until the next command is
supplied when the Update IR state is active.
SAMPLE/PRELOAD
SAMPLE/PRELOAD is a 1149.1 mandatory instruction. When
the SAMPLE/PRELOAD instructions are loaded into the instruc-
tion register and the TAP controller is in the Capture-DR state, a
snapshot of data on the inputs and output pins is captured in the
boundary scan register.
the SAMPLE/PRELOAD instructions are loaded into the instruc-
tion register and the TAP controller is in the Capture-DR state, a
snapshot of data on the inputs and output pins is captured in the
boundary scan register.
The user must be aware that the TAP controller clock can only
operate at a frequency up to 20 MHz, while the SRAM clock
operates more than an order of magnitude faster. Because there
is a large difference in the clock frequencies, it is possible that
when the Capture-DR state is active, an input or output under-
goes a transition. The TAP may then try to capture a signal while
in transition (metastable state). This does not harm the device,
but there is no guarantee as to the value that is captured. Re-
peatable results may not be possible.
operate at a frequency up to 20 MHz, while the SRAM clock
operates more than an order of magnitude faster. Because there
is a large difference in the clock frequencies, it is possible that
when the Capture-DR state is active, an input or output under-
goes a transition. The TAP may then try to capture a signal while
in transition (metastable state). This does not harm the device,
but there is no guarantee as to the value that is captured. Re-
peatable results may not be possible.
To guarantee that the boundary scan register captures the cor-
rect value of a signal, the SRAM signal must be stabilized long
enough to meet the TAP controller's capture setup plus hold
times (t
rect value of a signal, the SRAM signal must be stabilized long
enough to meet the TAP controller's capture setup plus hold
times (t
CS
and t
CH
). The SRAM clock input might not be captured
correctly if there is no way in a design to stop (or slow) the clock
a SAMPLE/PRELOAD instruction. If this is an issue, it is still
possible to capture all other signals and simply ignore the value
of the CK and CK captured in the boundary scan register.
a SAMPLE/PRELOAD instruction. If this is an issue, it is still
possible to capture all other signals and simply ignore the value
of the CK and CK captured in the boundary scan register.
After the data is captured, it is possible to shift out the data by
putting the TAP into the Shift-DR state. This places the boundary
scan register between the TDI and TDO pins.
putting the TAP into the Shift-DR state. This places the boundary
scan register between the TDI and TDO pins.
PRELOAD enables an initial data pattern to be placed at the
latched parallel outputs of the boundary scan register cells be-
fore the selection of another boundary scan test operation.
latched parallel outputs of the boundary scan register cells be-
fore the selection of another boundary scan test operation.
The shifting of data for the SAMPLE and PRELOAD phases can
occur concurrently when required — that is, while data captured
is shifted out, shift in the preloaded data.
occur concurrently when required — that is, while data captured
is shifted out, shift in the preloaded data.
BYPASS
When the BYPASS instruction is loaded in the instruction register
and the TAP is placed in a Shift-DR state, the bypass register is
placed between the TDI and TDO pins. The advantage of the
BYPASS instruction is that it shortens the boundary scan path
when multiple devices are connected together on a board.
and the TAP is placed in a Shift-DR state, the bypass register is
placed between the TDI and TDO pins. The advantage of the
BYPASS instruction is that it shortens the boundary scan path
when multiple devices are connected together on a board.
EXTEST
The EXTEST instruction enables the preloaded data to be driven
out through the system output pins. This instruction also selects
the boundary scan register to be connected for serial access
between the TDI and TDO in the shift-DR controller state.
out through the system output pins. This instruction also selects
the boundary scan register to be connected for serial access
between the TDI and TDO in the shift-DR controller state.
EXTEST Output Bus Tri-State
IEEE Standard 1149.1 mandates that the TAP controller be able
to put the output bus into a tri-state mode.
to put the output bus into a tri-state mode.
The boundary scan register has a special bit located at bit 47.
When this scan cell, called the “extest output bus tri-state”, is
latched into the preload register the Update-DR state in the TAP
controller, it directly controls the state of the output (Q-bus) pins,
when the EXTEST is entered as the current instruction. When
HIGH, it enables the output buffers to drive the output bus. When
LOW, this bit places the output bus into a High-Z condition.
When this scan cell, called the “extest output bus tri-state”, is
latched into the preload register the Update-DR state in the TAP
controller, it directly controls the state of the output (Q-bus) pins,
when the EXTEST is entered as the current instruction. When
HIGH, it enables the output buffers to drive the output bus. When
LOW, this bit places the output bus into a High-Z condition.
Set this bit by entering the SAMPLE/PRELOAD or EXTEST
command, and then shifting the desired bit into that cell, when
the Shift-DR state is active. When the Update-DR is active, the
value loaded into that shift-register cell latches into the preload
register. When the EXTEST instruction is entered, this bit directly
controls the output Q-bus pins. Note that this bit is preset HIGH
to enable the output when the device is powered up, and also
when the TAP controller is in the Test-Logic-Reset state.
command, and then shifting the desired bit into that cell, when
the Shift-DR state is active. When the Update-DR is active, the
value loaded into that shift-register cell latches into the preload
register. When the EXTEST instruction is entered, this bit directly
controls the output Q-bus pins. Note that this bit is preset HIGH
to enable the output when the device is powered up, and also
when the TAP controller is in the Test-Logic-Reset state.
Reserved
These instructions are not implemented but are reserved for
future use. Do not use these instructions.
future use. Do not use these instructions.