Agilent Technologies 8164A Manual De Usuario
Agilent 8163A/B, 8164A/B & 8166A/B Mainframes, Sixth Edition
271
Index
B
Binary block
Brightness
C
Channel Numbers
Command summary
Common commands
Compatibility
Continuous measurement
Contrast
Coordination of modules
example
D
Data Types
Date
Display
brightness
display contrast
Display Operations
DISPlay Subsystem
E
Error handling
Error strings
GPIB 258
Event register
operation enable
questionable enable
Event Status Enable
Event Status Register
F
FETCh subsystem
Fixed Laser Source
Set up example
G
GPIB Interface
H
Agilent VEE
I
Identification
IEEE-Common Commands
INITiate subsystem
Input queue
Installed options
Instrument addresses
Instrument Behaviour Settings
Instrument driver
Instrument driver installation
Interface
behaviour settings
L
LabView
LabWindows
Lambda scan
execute function
get parameters function
get result function
mult-frame
prepare function
Lambda scans
Laser
state
switch on
Laser Selection Numbers
Local control
LOCK subsystem
Measurement
start
Measurement Functions
Message queues
Operation Complete
Operation enable
Options
Output queue
OUTPut subsystem
P
Power measurement
example of FETCh and READ usage
Power Meter
continuous measurement
start measurement
Power meter
configure all
continuous measurement
current value
read all
Power variation with wavelength
Q
Questionable enable
R
READ subsystem
Register
Operational Slot Status
Questionable slot status
Standard Event Status
Status byte
Status summary
register mainframe
Reset
Return Loss
current monitor value
current value
Root layer commands
S
SCPI revision
Self-test
SENSe subsystem
Signal conditioning
Signal condtioning
Signal generation
Slot Numbers
SLOT subsystem
SOURce subsystem
SPECial subsystem
Specific Command Summary
Start
laser
measurement
power meter measurement
Status Byte
Status Command Summary
Status Information