Intel D525 AU80610006225AA Manual De Usuario

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Testability 
10
Testability 
In Intel Atom Processor D400 and D500 Series, testability for Automated Test 
Equipment (ATE) board level testing has been implemented as JTAG boundary scan.
10.1
JTAG Boundary Scan
The Intel Atom Processor D400 and D500 Series add Boundary Scan ability compatible 
with the IEEE 1149.1-2001 Standard (Teset Access Port and Boundary-Scan 
Architecture) specification. 
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