HP 37717c Manual De Usuario

Descargar
Página de 12
6
STM-0e/STM-1e test
and interfaces
Option A3R
Page 
8
STM-0e (52 Mb/s) and STM-1e
(155 Mb/s) electrical
interface: STM-0/STM-1
overhead access, thru mode
and pointer sequences ,
TU-12, TU-2, VC-3 and VC-4
mappings.
Optical
interfaces
Option UH1
Page 10
155 Mb/s (1310 nm).
Option 130
Page 10
622/155/52 Mb/s (1310 and
1550 nm), optical power
measurement.
Option 131
Page 10
622/155/52 Mb/s (1310 nm),
optical power measurement.
Option 0YH
Page 10
622/155/52 Mb/s binary (NRZ)
interfaces. Must also order
option 130 or 131.
Jitter, wander and slips
testing – generation
Option A3K
Page 9
PDH and SDH jitter and
wander generation.
Option  140
Page 9
PDH and SDH jitter
generation.
Jitter, wander and slips
testing – measurement
Option UHN
Page 9
PDH jitter measurement: 2, 8,
34 and 140 Mb/s.
Option A3L
Page 9
STM-1e line and PDH jitter
measurement: 2, 8, 34, 140
and 155 Mb/s.
Option A3V
Page 9
STM-1o, STM-1e line and PDH
jitter measurement: 2, 8, 34,
140 Mb/s and 155 Mb/s.
Option A3N
Page 9
STM-4o, STM-1o, STM-1e line
and PDH jitter measurement:
2, 8, 34, 140 Mb/s, 155 Mb/s
and 622 Mb/s.
PDH/ATM cell test
and PDH interfaces
Option UKK
Page 8
Unstructured PDH: 0.7, 2, 8,
34 and 140 Mb/s.
Option UKJ
Page 8
Structured PDH: 2, 8, 34 and
140 Mb/s.
Option UKN
Page 8
ATM cell: 2, 34 and 140 Mb/s
(includes  all capability of
option UKJ).
Option UH3
Page 
9
Binary (NRZ) clock and data
plus external clock input.
Must also order option UKK,
UKJ or UKN.
Option UHC
Page 
11
Three additional 2, 8, 34 and
140 Mb/s outputs. Must also
order option UKK, UKJ or
UKN.
Module interworking section
PDH/SDH and ATM cell layer supported configurations
PDH/DSn interfaces
Option 110
Page 8
Structured PDH: DS1, DS3,
E1, E3.
Option UKK
Page 8
Unstructured PDH: 0.7, 2, 8,
34 and 140 Mb/s.
Option UKJ
Page 8
Structured PDH: 2, 8, 34 and
140 Mb/s.
Option UKN
Page 8
ATM cell: 2, 34 and 140 Mb/s
(includes  all capability of
option UKJ).
Option UH3
Page 
9
Binary (NRZ) clock and data
plus external clock input.
Must also order option UKK,
UKJ, UKN or 110.
Jitter, wander and slips
testing – generation*
Option A3K
Page 9
PDH, 155 Mb/s, 622 Mb/s
jitter and wander generation.
Option  140
Page 9
As option A3K, but without
wander generation.
Jitter, wander and slips
testing – measurement*
Option UHN
Page 9
PDH jitter measurement.
Option A3L
Page 9
155 Mb/s electrical and PDH
jitter measurement.
Option A3V
Page 9
155 Mb/s optical, electrical
and PDH jitter measurement.
Option A3N
Page 9
622 Mb/s and 155 Mb/s
optical, electrical and PDH
jitter measurement.
Dual standard SONET/SDH and DSn/PDH supported configurations
SONET/SDH
test and interfaces
Option 120
Page 8
STS-1/STM-0e (52 Mb/s) and
STS-3/STM-1e (155 Mb/s)
electrical interface:
Overhead access, thru mode
and pointer sequences.
VT1.5/TU-11, VT2/TU-12,
VT6/TU-2, VC-3/STS-1 SPE
and VC-4/STS-3c SPE
mappings.
Optical
interfaces
Option UH1
Page 10
155 Mb/s (1310 nm).
Option 130
Page 10
622/155/52 Mb/s optical
interface (1310 and
1550 nm),  optical power
measurement.
Option 131
Page 10
622/155/52 Mb/s optical
interface (1310 nm), optical
power measurement.
Option 0YH
Page 10
622/155/52 Mb/s binary
(NRZ) interfaces. Must also
order  option 130 or 131.
The following three tables indicate which modules are capable of networking with
each other. Choose one from each category (if required)†