gml gml2032 Manual De Usuario
Specification Notes
* All tests conducted at the GML laboratory using the Audio Precision System Two Cascade Dual Domain (AP S2C), or else as noted. Unless
otherwise specified, all tests include AP S2C residual measurement and were conducted under the following conditions: Rs=40Ω, RL=100kΩ,
<10Hz to >500kHz analyzer bandwidth. GML reserves the right to make changes to these specifications and/or any of its products as it deems
necessary. Individual unit performance may vary due to environmental influences, manufacturing variations, and component tolerances.
otherwise specified, all tests include AP S2C residual measurement and were conducted under the following conditions: Rs=40Ω, RL=100kΩ,
<10Hz to >500kHz analyzer bandwidth. GML reserves the right to make changes to these specifications and/or any of its products as it deems
necessary. Individual unit performance may vary due to environmental influences, manufacturing variations, and component tolerances.
1
CMRR determined by calculating the average across a 200-point logarithmic frequency sweep from 20 Hz to 20 kHz.
DUT set to 70dB +0dB gain, +20 dBu CMTST signal from AP S2C.
2
Clipping as determined by THD+N in excess of 0.1% for Mic and Inseert inputs, 1.0% for MI input. MI clipping, as
stated, is independent of gain setting since the MI input buffer clips before the gain stage(s).
3
All PREAMPLIFIER measurements taken from Insert Out XLR, Insert switch engaged
4
All bandwidth tests conducted at +0.0 dBu DUT output level for 1kHz reference. Measurements are typical across the
gain range of the DUT. Default gain settings: 45dB +0dB, Mic and MI; 0dB, Insert (default; no gain control).
5
Direct -3 dB measurement using HP 3314A function generator (Rs=50Ω) and Tektronix 2445 150MHz analog
oscilloscope (Rin=1MΩ, 15pF) unbalanced into R
L
= 20kΩ termination. DUT gain set to 15dB +0dB. The low-frequency
-3 dB corner of the Model 2032 exceeds the LF response of the HP 3314A, which has a -3 dB corner at 7 Hz.
6
Includes AP S2C residual THD+N of 0.0007% and Analyzer 30 kHz LPF. Test conducted with -25 dBu swept sine, Mic
input, 45dB +0dB gain setting. System noise contributes –77 dBu (0.0011%) to this figure.
7
Test conducted using AP System One. Measurement includes System One residual IMD of 0.001%. SMPTE/DIN 4:1
signal, 7 kHz and 60 Hz applied at -35 dBu. DUT set for 45dB +0dB gain, Mic input.
8
Noise measurement with Rs=150Ω balanced termination. Specification includes 2
nd
order LPF at 30 kHz. Theoretical
source resistance noise for this bandwidth is –129.1 dBu. Mic input, 70dB +0dB gain setting. Un-weighted.
9
Includes AP S2C residual THD+N of 0.0007% and Analyzer 30 kHz LPF. Test conducted with -15 dBu swept sine, MI
input, 15dB +0dB gain setting. System noise contributes –85 dBu (0.0044%) to this figure.
10
Test conducted using AP System One. Measurement includes System One residual IMD of 0.001%. SMPTE/DIN 4:1
signal, 7 kHz and 60 Hz applied at -25 dBu. DUT set for 45dB +0dB gain, MI input.
11
Noise measurement with Rs=150Ω unbalanced termination. Specification includes 2
nd
order LPF at 30 kHz.
Theoretical source resistance noise for this bandwidth is –129.1 dBu. MI input, 70dB +0dB gain setting. Un-weighted.
12
All EQUALIZER measurements taken from Output XLR, signal applied to Insert In XLR, Insert switch engaged.
13
Direct -3 dB measurement using HP 3314A function generator (Rs=50Ω) and Tektronix 2445 150MHz analog
oscilloscope (Rin=1MΩ, 15pF) unbalanced into R
L
= 20kΩ termination. The low-frequency -3 dB corner of the Model
2032 exceeds the LF response of the HP 3314A, which has a -3 dB corner at 7 Hz.
14
Includes AP S2C residual THD+N of 0.0007% and Analyzer 30 kHz LPF. Test conducted with +20 dBu swept sine,
Insert In. System noise contributes –98 dBu (0.0001%) to this figure.
15
Test conducted using AP System One. Measurement includes System One residual IMD of 0.001%. SMPTE/DIN 4:1
signal, 7 kHz and 60 Hz applied at +10 dBu to Insert In.
16
Noise measurement with Rs=40Ω balanced termination. Specification includes 2
nd
order LPF at 30 kHz. This figure
denotes the residual broadband noise floor, un-weighted. It is important to note that hardware limitations of the AP S2C,
especially low-level reading resolution, prevent a more accurate absolute-noise measurement for low-gain DUT settings.
especially low-level reading resolution, prevent a more accurate absolute-noise measurement for low-gain DUT settings.
17
Control settings, all bands: 0dB cut/boost, minimum frequency, minimum Q.
18
Includes AP S2C residual THD+N of 0.0007% and Analyzer 30 kHz LPF. Test conducted with +20 dBu swept sine,
Insert In. System noise contributes –78 dBu (0.001%) to this figure.
19
Test conducted using AP System One. Measurement includes System One residual IMD of 0.001%. SMPTE/DIN 4:1
signal, 7 kHz and 60 Hz applied at +10 dBu to Insert In.
20
Includes AP S2C Analyzer 30 kHz LPF. <-78 dBu versus -98 dBu noise, un-weighted. Noise Figure is calculated by
the root-sum-of-squares method, using the EQ Out state as the voltage noise reference.
21
Includes AP S2C residual crosstalk of -140 dB. Test conducted with +10 dBu 1.0 kHz balanced to Mic input, DUT set
for 15dB +0dB gain, Insert switch engaged, Output signal measured. Equalizer to Preamp crosstalk, Mic to MI crosstalk,
and MI to Mic crosstalk could not be determined since the noise floor exceeds crosstalk components.
and MI to Mic crosstalk could not be determined since the noise floor exceeds crosstalk components.
22
Clipping as determined by THD+N in excess of 0.1% over a 30kHz bandwidth, R
L
= 100kΩ. Outputs clip at +25.3 dBu
for R
L
= 600Ω. NOTE: Driving loads <600Ω at high signal levels can damage the unit.