Texas Instruments OPA1S2385 Evaluation Module OPA1S2385EVM OPA1S2385EVM Hoja De Datos
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OPA1S2385EVM
SBOS645A – DECEMBER 2012 – REVISED JUNE 2013
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE INFORMATION
(1)
SPECIFIED
PACKAGE
TEMPERATURE
PACKAGE
PRODUCT
PACKAGE-LEAD
DESIGNATOR
RANGE
MARKING
ORDERING NUMBER
OPA1S2384IDRCT
OPA1S2384
SON-10
DRC
–40°C to +85°C
OVAQ
OPA1S2384IDRCR
OPA1S2385IDRCT
OPA1S2385
SON-10
DRC
–40°C to +85°C
OUZQ
OPA1S2385IDRCR
(1)
For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the
product folder at
product folder at
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range (unless otherwise noted).
OPA1S238x
UNIT
Supply voltage, V+ to V–
6
V
Voltage
(2)
(V–) – 0.3 to (V+) + 0.3
V
Signal input terminals, op amp
section
section
Current
(2)
±10
mA
On-state switch current; V
IN S
, V
+IN B
= 0 to V+
±20
mA
Output (OUT A, OUT B) short-circuit current
(3)
Continuous
Digital input voltage range (SC pin)
–0.3 to +6
V
Digital input clamp current (SC pin)
–50
mA
Operating temperature, T
A
–40 to +125
°C
Storage temperature, T
stg
–65 to +150
°C
Junction temperature, T
J
+150
°C
Human body model (HBM)
4000
V
Electrostatic discharge (ESD)
ratings
ratings
Charged-device model (CDM)
1000
V
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2)
Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5 V beyond the supply rails should
be current limited to 10 mA or less.
be current limited to 10 mA or less.
(3)
Short-circuit to ground, one amplifier per package.
2
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