Texas Instruments 2.5A, 10.8 to 13.2 Vin, SWIFT™ Converter Evaluation Module TPS54260EVM-597 TPS54260EVM-597 Hoja De Datos
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TPS54260EVM-597
EFFICIENCY - Vin = 12 V
0
10
20
30
40
50
60
70
80
90
100
0
0.5
1
1.5
2
2.5
3
Output Current - A
E
ff
ic
ie
n
c
y
-
%
Test Setup and Results
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2.1
Input/Output Connections
The TPS54260EVM-597 is provided with input/output connectors and test points as shown in
. A
power supply capable of supplying 1.5 A must be connected to J1 through a pair of 20 AWG wires. The
load must be connected to J2 through a pair of 20 AWG wires. The maximum load current capability must
be 2.5 A. Wire lengths must be minimized to reduce losses in the wires. Test-point TP1 provides a place
to monitor the V
load must be connected to J2 through a pair of 20 AWG wires. The maximum load current capability must
be 2.5 A. Wire lengths must be minimized to reduce losses in the wires. Test-point TP1 provides a place
to monitor the V
IN
input voltages with TP2 providing a convenient ground reference. TP9 is used to monitor
the output voltage with TP10 as the ground reference.
Table 4. EVM Connectors and Test Points
Reference Designator
Function
J1
V
IN
(see
for V
IN
range)
J2
V
OUT
, 3.3 V at 0.5 A maximum
TP1
V
IN
test point at V
IN
connector
TP2
GND test point at V
IN
TP3
EN test point. Connect EN to ground to disable, open to enable.
TP4
Slow start monitor test point
TP5
PWRGD test point
TP6
PH test point
TP7
Output voltage test point at voltage divider. Used for loop response measurements.
TP8
Test point between voltage divider network and output. Used for loop response measurements.
TP9
Output voltage test point at OUT connector
TP10
GND test point at OUT connector
2.2
Efficiency
The efficiency of this EVM peaks at a load current of about 0.8 A with V
IN
= 12 V, and then decreases as
the load current increases towards full load.
shows the efficiency for the TPS54260EVM-597 at
an ambient temperature of 25°C.
Figure 1. TPS54260EVM-597 Efficiency
4
TPS54260EVM-597 2.5-A, SWIFT™ Regulator Evaluation Module
SLVU372 – March 2009
Copyright © 2009, Texas Instruments Incorporated