STMicroelectronics M48Z02-150PC1 Memory IC M48Z02-150PC1 Hoja De Datos

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M48Z02-150PC1
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Operation modes
M48Z02, M48Z12
Doc ID 2420 Rev 9
2.4 V
CC
 noise and negative going transients
I
CC
 transients, including those produced by output switching, can produce voltage 
fluctuations, resulting in spikes on the V
CC
 bus. These transients can be reduced if 
capacitors are used to store energy which stabilizes the V
CC
 bus. The energy stored in the 
bypass capacitors will be released as low going spikes are generated or energy will be 
absorbed when overshoots occur. A ceramic bypass capacitor value of 0.1 µF (as shown in 
) is recommended in order to provide the needed filtering.
In addition to transients that are caused by normal SRAM operation, power cycling can 
generate negative voltage spikes on V
CC
 that drive it to values below V
SS
 by as much as 
one volt. These negative spikes can cause data corruption in the SRAM while in battery 
backup mode. To protect from these voltage spikes, STMicroelectronics recommends 
connecting a Schottky diode from V
CC
 to V
SS
 (cathode connected to V
CC
, anode to V
SS
). 
Schottky diode 1N5817 is recommended for through hole and MBRS120T3 is 
recommended for surface mount.
Figure 8.
Supply voltage protection
AI02169
VCC
0.1µF
DEVICE
VCC
VSS