Freescale Semiconductor Demonstration Board for Freescale MC9S12XHY256 Microcontroller DEMO9S12XHY256 DEMO9S12XHY256 Manual De Usuario
Los códigos de productos
DEMO9S12XHY256
Electrical Characteristics
MC9S12XHY-Family Reference Manual, Rev. 1.04
736
Freescale Semiconductor
Table A-14. ATD Conversion Performance 5V range
Table A-15. ATD Conversion Performance 3.3V range
A.3
NVM, Flash
A.3.1
Timing Parameters
The time base for all NVM program or erase operations is derived from the oscillator. A minimum
oscillator frequency f
oscillator frequency f
NVMOSC
is required for performing program or erase operations. The NVM modules
do not have any means to monitor the frequency and will not prevent program or erase operation at
frequencies above or below the specified minimum. When attempting to program or erase the NVM
modules at a lower frequency, a full program or erase transition is not assured.
frequencies above or below the specified minimum. When attempting to program or erase the NVM
modules at a lower frequency, a full program or erase transition is not assured.
The program and erase operations are timed using a clock derived from the oscillator using the FCLKDIV
register. The frequency of this clock must be set within the limits specified as f
register. The frequency of this clock must be set within the limits specified as f
NVMOP
.
Conditions are shown in
REF
= V
RH
- V
RL
= 5.12V. f
ATDCLK
= 8.0 MHz
The values are tested to be valid with no PortAD output drivers switching simultaneous with conversions.
Num
C
Rating
1,2
1
The 8-bit and 10-bit mode operation is structurally tested in production test. Absolute values are tested in 12-bit mode.
2
Better performance is possible using specially designed multi-layer PCBs or averaging techniques.
Symbol
Min
Typ
Max
Unit
1
P Resolution
10-Bit
LSB
—
5
—
mV
2
P Differential Nonlinearity
10-Bit
DNL
-1
±
0.5
1
counts
3
P Integral Nonlinearity
10-Bit
INL
-2
±
1
2
counts
4
P Absolute Error
10-Bit
AE
-3
±
2
3
counts
5
C Resolution
8-Bit
LSB
—
20
—
mV
6
C Differential Nonlinearity
8-Bit
DNL
-0.5
±
0.3
0.5
counts
7
C Integral Nonlinearity
8-Bit
INL
-1
±
0.5
1
counts
8
C Absolute Error
8-Bit
AE
-1.5
±
1
1.5
counts
Conditions are shown in
REF
= V
RH
- V
RL
= 3.3V. f
ATDCLK
= 8.0 MHz
The values are tested to be valid with no PortAD output drivers switching simultaneous with conversions.
Num
C
Rating
1,2
1
The 8-bit and 10-bit mode operation is structurally tested in production test. Absolute values are tested in 12-bit mode.
2
Better performance is possible using specially designed multi-layer PCBs or averaging techniques.
Symbol
Min
Typ
Max
Unit
1
P Resolution
10-Bit
LSB
—
3.22
—
mV
2
P Differential Nonlinearity
10-Bit
DNL
-1.5
±
1
1.5
counts
3
P Integral Nonlinearity
10-Bit
INL
-2
±
1
2
counts
4
P Absolute Error
10-Bit
AE
-3
±
2
3
counts
5
C Resolution
8-Bit
LSB
—
12.89
—
mV
6
C Differential Nonlinearity
8-Bit
DNL
-0.5
±
0.3
0.5
counts
7
C Integral Nonlinearity
8-Bit
INL
-1
±
0.5
1
counts
8
C Absolute Error
8-Bit
AE
-1.5
±
1
1.5
counts