Atmel Xplained Pro Evaluation Kit ATSAMD20-XPRO ATSAMD20-XPRO Hoja De Datos

581

Atmel | SMART SAM D20 [DATASHEET]

Atmel-42129K–SAM-D20_datasheet–06/2014

Note:

1.

These values are based on characterization. These values are not covered by test limits in production.

2.

See also rev C errata concerning the temperature sensor.

The temperature sensor behavior is linear but it depends on several parameters such as the internal voltage reference 
which itself depends on the temperature. To take this into account, each device contains a Temperature Log row with 
data measured and written during the production tests. These calibration values should be read by software to infer the 
most accurate temperature readings possible.

This Software Temperature Log row can be read at address 0x00806030. The Software Temperature Log row cannot be 
written.

This section specifies the Temperature Log row content and explains how to refine the temperature sensor output using 
the values in the Temperature Log row.

All values in this row were measured in the following conditions:

z

V

DDIN

 = V

DDIO

 = V

DDANA

 = 3.3V

z

ADC Clock speed = 1MHz

z

ADC mode: Free running mode, ADC averaging mode with 4 averaged samples

z

ADC voltage reference = 1.0V internal reference (aka INT1V)

z

ADC input = temperature sensor

I

Temperature sensor output 
voltage

T= 25°C, V

DDANA

 = 3.3V

-

0.667

-

V

I

Temperature sensor slope

2.3

2.4

2.5

mV/°C

I

Variation over V

DDANA

 voltage

V

DDANA

=1.62V to 3.6V

-1.7

1

3.7

mV/V

7:0

ROOM_TEMP_VAL_INT

Integer part of room temperature in °C

11:8

ROOM_TEMP_VAL_DEC

Decimal part of room temperature

19:12

HOT_TEMP_VAL_INT

Integer part of hot temperature in °C

23:20

HOT_TEMP_VAL_DEC

Decimal part of hot temperature

31:24

ROOM_INT1V_VAL

2’s complement of the internal 1V reference drift at room 

temperature (versus a 1.0 centered value)