STMicroelectronics Evaluation board for A5970AD EVALA5970AD EVALA5970AD Hoja De Datos

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DocID14661 Rev 5

The 100% of the population in the production flow is tested at three different ambient 
temperatures (-40 

C, +25 C, +125 C) to guarantee the datasheet parameters inside the 

junction temperature range (-40 

C, +125 C).

The device operation is so guaranteed when the junction temperature is inside the (-40 

C, 

+150 

C) temperature range. The designer can estimate the silicon temperature increase 

respect to the ambient temperature evaluating the internal power losses generated during 
the device operation (please refer to the 

However the embedded thermal protection disables the switching activity to protect the 
device in case the junction temperature reaches the T

SHTDWN 

(+150 

C ± 10 C) 

temperature. 

All the datasheet parameters can be guaranteed to a maximum junction temperature of 
+125 

C to avoid triggering the thermal shutdown protection during the testing phase 

because of self-heating.