LSI 53C875A Manual De Usuario

1. These values are guaranteed by periodic characterization; they are not 100% tested on every

device.

V

OH

2

2. Active negation outputs only: Data, Parity, SREQ/, SACK/.

Output high voltage

2.0

V

DD

+0.3

V

I

OH

= 7 mA

V

OL

Output low voltage

V

SS

0.5

V

I

OL

= 48 mA

V

IH

Input high voltage

2.0

V

DD

+0.3

V

–

V

IL

Input low voltage

V

SS

−

0.3

0.8

V

Referenced to V

SS

V

IK

Input clamp voltage

−

0.66

−

0.77

V

V

DD

= 4.75; I

I

=

−

20 mA

V

TH

Threshold, HIGH to LOW

1.0

1.2

V

–

V

TL

Threshold, LOW to HIGH

1.4

1.6

V

–

V

TH

–V

TL

Hysteresis

300

500

mV

–

I

OH

2

Output high current

2.5

24

mA

V

OH

= 2.5 V

I

OL

Output low current

100

200

mA

V

OL

= 0.5 V

I

OSH

2

Short-circuit output high current

–

625

mA

Output driving low, pin

shorted to V

DD

supply

3

3. Single pin only; irreversible damage may occur if sustained for one second.

I

OSL

Short-circuit output low current

–

95

mA

Output driving high, pin

shorted to V

SS

supply

I

LH

Input high leakage

–

20

µ

A

−

0.5 < V

DD

< 5.25

V

PIN

= 2.7 V

I

LL

Input low leakage

–

−

20

µ

A

−

0.5 < V

DD

< 5.25

V

PIN

= 0.5 V

R

I

Input resistance

20

–

M

Ω

SCSI pins

C

P

Capacitance per pin

–

15

pF

PQFP

t

R

2

Rise time, 10% to 90%

4.0

18.5

ns

t

F

Fall time, 90% to 10%

4.0

18.5

ns

dV

H

/dt

Slew rate, LOW to HIGH

0.15

0.50

V/ns

dV

L

/dt

Slew rate, HIGH to LOW

0.15

0.50

V/ns

ESD

Electrostatic discharge

2

–

KV

MIL-STD-883C; 3015-7

Latch-up

100

–

mA

–

Filter delay

20

30

ns

Ultra filter delay

10

15

ns

Extended filter delay

40

60

ns