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GE
Intelligent Platforms
Deployed Test
Features/Benefits Summary
Features   
    
Function/Benefits
Two Deployed Test  
software components 
offered  (BIT and BCS)
Each tailored for a different test-phase/strategy. Use of both provides the best possible overall Deployed Test strategy, adapted for 
the realities of merchant silicon and the use of a standard COTS operating system (OS).
Built-in test (BIT)
Completely OS-independent.
Intrusive
Intrusive testing provides the highest possible coverage and confidence.
Initialization phase only
Ensures no intrusive testing can possibly disturb the OS or application.
95% or better coverage
Functionally verifiable, using the ‘stuck nodes’ method with statistically valid sample sizes for fault injection.
Optional ‘Edge Node’ tests
Additional to the ‘Internal Node’ tests that are fully onboard the single board computer (SBC). Allows the use of standard BIT for accep-
tance test procedures (ATP), as well as deployment. No separate ATP software needs to be commissioned.  Also, some ‘edge node’ tests 
can usually be enabled in deployment, increasing the overall system test coverage. Standardized responses are verified wherever 
possible (e.g. normal response to an initiated Ethernet ‘ping’).
Highly configurable
Standard BIT product can be used in almost all circumstances, without recourse to source code, or invoking development time. 
Automatic or 
interactive testing
Configure and forget, or use for first stage field diagnosis.
High test-resolution  
flexibility
Can balance the best depth of coverage for the required maximum execution time, giving a best fit to the application circumstances.
Fast BIT
‘Best coverage in one second’ option.
Fast Start
Bypasses all tests in an emergency start-up condition (e.g. an in-air brown-out). Fast Start situation sampled from the backplane.
Flexible results storage
For easy integration, BIT can store results in nominated Flash, RAM, or bus memory locations, for later pick-up by the application.
Immediate failure    
indication
Via an SBC LED: also a backplane output for system notification.
System-wide
Minimizes integration. BIT tests and collates results for all GE Intelligent Platform boards/daughter boards connected in the system.
Field upgradeable
Later GE Intelligent Platform BIT versions that run a wider range of hardware can be field-installed on older boards, providing unit 
compatibility or cross-program commonality.
Extendable
Custom tests (e.g. for proprietary PMCs) easily added using a standard template. No purchase of BIT source code is required for this purpose.