Hitachi HUS157373EL3600 Manuel D’Utilisation

Drawing No. Sheet No. Revision 5

K6602906

26/46

2003/6/12

7.4 Precautions on the off-line test or bench test

When the off-line test or bench test is performed the drive should be tightly fixed
and cooled. The set-up should be similar to the actual system configuration.

7.5 Cooling of the drive

Keep the drive (HDA and PCB) cool by using a FAN. Reliability and life of the drive
increases as the temperature is lower.

7.6 Reliability temperature

The temperature measurement points and temperature limits are shown below.
1. The maximum temperature assures the data reliability, seek error rate, and must not

be exceeded.

2. The reliability temperature maintains the MTBF of the drive and must not be

exceeded in order to ensure its reliability. MTBF is also based on a nominal voltage
condition.

3. The maximum temperature of HDA includes momentary temperature rise. Average

temperature of HDA has to be less than this temperature.

        Table 7.1 Temperature Limits (unit: °C)

Measurement points

HDA(top)

HDA(bottom)

IC(RW)

IC(MPU)

Maximum temperature

65

65

85

85

Reliability temperature

50

50

70

70

                                 HDA(top)                    IC(RW)  HDA(bottom)

     

                   Breathing hole                          IC(MPU)