mitutoyo 501s Manuel D’Utilisation

 

 
To perform dual measurement with a combination of two measuring units, each 

measuring unit must have been optically aligned.   

Refer to “4.3 Optical Axis Alignment” for more information. 
Also note that the appropriate considerations must be taken into account according 

to the type of dual measurement, DXY type or DF type. 

 

If a workpiece with a high-reflection coefficient is 

measured with two measuring units being 
completely crossed (in a DXY-type setup), the 
scanning beam from one measuring unit will be 
reflected into the reception window of the other 
measuring unit, reducing the measuring accuracy. 
An arrangement is required in such a case so that 
the light from one measuring unit will not be 
reflected from the workpiece into the reception 
window of the counterpart measuring unit. 

L i g h t   f r o m   t h e   Y - a x i s  
r e f l e c t e d   t o   t h e   X - a x i s .

Y

- a x i s

 

i s

X

- a x

 
 

 

(1) Arrangement to provide a step 

L

 

i s

 

 

Y

- a x i

As shown on the right, arrange a step of L 

between the X axis and the Y axis. 

The step L should not be smaller than 10 mm. 

 

X

- a x

s

 
 
 
 
 
 
 

 

 

(2) Arrangement to provide an angle 

As shown on the right, arrange an angle 

θ 

between the X axis and the Y axis. 

The angle 

θ should not be smaller than 15 degrees 

or 0.25 radians. 

 
 
 
 
 
 

Y

- a x i s

 

X

- a x i s

 

θ