Hitachi 100GB 7200 RPM HTE721010G9SA00 Manuel D’Utilisation
Codes de produits
HTE721010G9SA00
Travelstar E7K100 (SATA) Hard Disk Drive Specification
162
12.40.6 Self-test log data structure
The following defines the 512 bytes that make up the Self-test log sector. All multibyte fields shown in these data
structures follow the ATA/ATAPI-6 specifications for byte ordering.
structures follow the ATA/ATAPI-6 specifications for byte ordering.
Table 111: Self-test log data structure
Note: N is 0 through 20
The data structure contains the descriptor of the Self-test that the device has performed. Each descriptor is 24 bytes
long and the self-test data structure is capable to contain up to 21 descriptors.
long and the self-test data structure is capable to contain up to 21 descriptors.
After 21 descriptors has been recorded, the oldest descriptor will be overwritten with the new descriptor.
The self-test log pointer points to the most recent descriptor. When there is no descriptor, the value is 0. When there
are descriptor(s), the value is 1 through 21.
are descriptor(s), the value is 1 through 21.
12.40.7 Selective self-test log data structure
The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select
the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents
of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the
specifications for byte ordering.
the parameters for the self-test and to monitor the progress of the self-test. The following table defines the contents
of the Selective self-test log which is 512 bytes long. All multi-byte fields shown in these data structures follow the
specifications for byte ordering.
Description
Byte
Offset
Data structure revision
2
00h
Self-test number
1
n*18h+02h
Self-test execution status
1
n*18h+03h
Life time power on hours
2
n*18h+04h
Self-test failure check point
1
n*18h+06h
LBA of first failure
4
n*18h+07h
Vendor specific
15
n*18h+08h
...
Vendor specific
2
1FAh
Self-test log pointer
1
1FCh
Reserved
2
1FDh
Data structure checksum
1
1FFh
512
Description
Bytes
Offset
Read/Write
Data structure revision
2
00h
R/W
Starting LBA for test span 1
8
02h
R/W
Ending LBA for test span 1
8
0Ah
R/W
Starting LBA for test span 2
8
12A
R/W
Ending LBA for test span 2
8
1Ah
R/W
Starting LBA for test span 3
8
22h
R/W
Ending LBA for test span 3
8
2Ah
R/W
Starting LBA for test span 4
8
32h
R/W
Ending LBA for test span 4
8
3Ah
R/W
Starting LBA for test span 5
8
42h
R/W