STMicroelectronics EVL6562A-35WFLB evaluation board using the L6562A EVL6562A-35WFLB EVL6562A-35WFLB Fiche De Données

Codes de produits
EVL6562A-35WFLB
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Thermal measurements
AN2838
14/23
DocID15099 Rev 2
4 Thermal 
measurements
To check the reliability of the design, thermal mapping by means of an IR camera was 
carried out. 
 and 
 show thermal measurements on the component side of 
the board at nominal input voltages and full load. Some pointers visible on the pictures 
placed across key components show the relevant temperature. 
 provides the 
correlation between the measured points and components, for both thermal maps. The 
ambient temperature during both measurements was 27 °C. According to these 
measurement results, all components on the board function within their temperature limits.
Figure 20. Thermal map at 90 V
AC
 - full 
load
Figure 21. Thermal map at 265 V
AC
 - full 
load
         
         
Table 2. Measured temperature @ 90 V
AC
 and 265 V
AC
 - full load
Component
Temperature @ 90 V
AC
Temperature @ 265 V
AC
MOSFET Q1
57.8 °C
43.8 °C
Secondary diode D5
58.9 °C
58.1 °C
Diode bridge D1
65.9 °C
45.6 °C
Transformer TR1 (bobbin)
64.3 °C
65.1 °C
Transformer TR1 (core)
54.5 °C
55 °C
Choke T1
55.7 °C
36. 2 °C
Choke T2
56 °C
38.2 °C
Transil D2
70 °C
59 °C