STMicroelectronics L6227 DMOS Evaluation Board EVAL6227PD EVAL6227PD Fiche De Données
Codes de produits
EVAL6227PD
DocID9453 Rev 2
21/32
L6227
Slow decay mode
32
Figure 17. t
DELAY
versus C
EN
(V
DD
= 5 V)
7.2 Thermal
protection
In addition to the overcurrent protection, the L6227 device integrates a thermal protection
for preventing the device destruction in case of junction overtemperature. It works sensing
the die temperature by means of a sensible element integrated in the die. The device
switches-off when the junction temperature reaches 165 °C (typ. value) with 15 °C
hysteresis (typ. value).
for preventing the device destruction in case of junction overtemperature. It works sensing
the die temperature by means of a sensible element integrated in the die. The device
switches-off when the junction temperature reaches 165 °C (typ. value) with 15 °C
hysteresis (typ. value).
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