Manuels d'utilisation pour National Instruments Welding System 321645c-01

Table des matières

• NI-DAQ Function Reference Manual for PC Compatibl...

  1
• Support

  2
  • Internet Support

    2
  • Bulletin Board Support

    2
  • Fax-on-Demand Support

    2
  • Telephone Support (USA)

    2
  • International Offices

    2
  • National Instruments Corporate Headquarters

    2
• Important Information

  3
  • Warranty

    3
  • Copyright

    3
  • Trademarks

    3
  • WARNING REGARDING MEDICAL AND CLINICAL USE OF NATI...

    3
• Contents

  4
• About This Manual

  12
  • How to Use the NIDAQ Manual Set

    12
  • Organization of This Manual

    12
  • Conventions Used in This Manual

    13
    • MIO and AI Device Terminology

      16
  • About the National Instruments Documentation Set

    18
  • Related Documentation

    19
  • Customer Communication

    19
• Chapter 1 Using the NI-DAQ Functions

  20
  • Status Codes, Device Numbers, and SCXI Chassis IDs...

    20
  • Variable Data Types

    21
    • Primary Types

      21
    • Arrays

      22
    • Multiple Types

      22
  • Programming Language Considerations

    23
    • Borland Delphi

      23
    • Visual Basic for Windows

      23
      • NIDAQ Constants Include File

        24
  • NIDAQ for LabWindows/CVI

    24
• Chapter 2 Function Reference

  34
  • AI_Change_Parameter

    34
  • AI_Check

    36
  • AI_Clear

    38
  • AI_Configure

    39
  • AI_Mux_Config

    43
  • AI_Read

    45
  • AI_Read_Scan

    47
  • AI_Setup

    48
  • AI_VRead

    50
  • AI_VRead_Scan

    52
  • AI_VScale

    53
  • Align_DMA_Buffer

    55
  • AO_Calibrate

    58
  • AO_Change_Parameter

    60
  • AO_Configure

    71
  • AO_Update

    75
  • AO_VScale

    76
  • AO_VWrite

    78
  • AO_Write

    80
  • Calibrate_1200

    82
  • Config_Alarm_Deadband

    96
  • Config_ATrig_Event_Message

    100
  • Calibrate_DSA

    88
  • Calibrate_E_Series

    91
  • Config_DAQ_Event_Message

    104
  • Configure_HW_Analog_Trigger

    116
  • CTR_Config

    123
  • CTR_EvCount

    125
  • CTR_EvRead

    127
  • CTR_FOUT_Config

    129
  • CTR_Period

    131
  • CTR_Pulse

    133
  • CTR_Rate

    137
  • CTR_Reset

    139
  • CTR_Restart

    140
  • CTR_Simul_Op

    141
  • CTR_Square

    143
  • CTR_State

    146
  • CTR_Stop

    147
  • DAQ_Check

    148
  • DAQ_Clear

    150
  • DAQ_Config

    151
  • DAQ_DB_Config

    154
  • DAQ_DB_HalfReady

    155
  • DAQ_DB_Transfer

    157
  • DAQ_Monitor

    159
  • DAQ_Op

    162
  • DAQ_Rate

    165
  • DAQ_Set_Clock

    167
  • DAQ_Start

    169
  • DAQ_StopTrigger_Config

    173
  • DAQ_to_Disk

    175
  • DAQ_VScale

    178
  • DIG_Block_Check

    180
  • DIG_Block_Clear

    181
  • DIG_Block_In

    182
  • DIG_Block_Out

    185
  • DIG_Block_PG_Config

    187
  • DIG_DB_Config

    191
  • DIG_DB_HalfReady

    193
  • DIG_DB_Transfer

    195
  • DIG_Grp_Config

    197
  • DIG_Grp_Mode

    199
  • DIG_Grp_Status

    202
  • DIG_In_Grp

    204
  • DIG_In_Line

    206
  • DIG_In_Port

    208
  • DIG_Line_Config

    210
  • DIG_Out_Grp

    211
  • DIG_Out_Line

    212
  • DIG_Out_Port

    214
  • DIG_Prt_Config

    216
  • DIG_Prt_Status

    219
  • DIG_SCAN_Setup

    221
  • DIG_Trigger_Config

    225
  • Get_DAQ_Device_Info

    228
  • Get_NI_DAQ_Version

    230
  • GPCTR_Change_Parameter

    231
  • GPCTR_Config_Buffer

    242
  • GPCTR_Control

    244
  • GPCTR_Read_Buffer

    246
  • GPCTR_Set_Application

    248
  • GPCTR_Watch

    278
  • ICTR_Read

    281
  • ICTR_Reset

    283
  • ICTR_Setup

    284
  • Init_DA_Brds

    288
  • Lab_ISCAN_Check

    296
  • Lab_ISCAN_Op

    299
  • Lab_ISCAN_Start

    303
  • Lab_ISCAN_to_Disk

    307
  • Line_Change_Attribute

    310
  • LPM16_Calibrate

    312
  • MIO_Calibrate

    313
  • MIO_Config

    317
  • RTSI_Clear

    319
  • RTSI_Clock

    320
  • RTSI_Conn

    322
  • RTSI_DisConn

    324
  • SC_2040_Config

    325
  • SCAN_Demux

    327
  • SCAN_Op

    329
  • SCAN_Sequence_Demux

    333
  • SCAN_Sequence_Retrieve

    336
  • SCAN_Sequence_Setup

    337
  • SCAN_Setup

    340
  • SCAN_Start

    342
  • SCAN_to_Disk

    348
  • SCXI_AO_Write

    352
  • SCXI_Cal_Constants

    355
  • SCXI_Calibrate_Setup

    363
  • SCXI_Change_Chan

    365
  • SCXI_Configure_Filter

    366
  • SCXI_Get_Chassis_Info

    369
  • SCXI_Get_Module_Info

    371
  • SCXI_Get_State

    373
  • SCXI_Get_Status

    375
  • SCXI_Load_Config

    377
  • SCXI_ModuleID_Read

    378
  • SCXI_MuxCtr_Setup

    380
  • SCXI_Reset

    382
  • SCXI_Scale

    385
  • SCXI_SCAN_Setup

    388
  • SCXI_Set_Config

    390
  • SCXI_Set_Gain

    393
  • SCXI_Set_Input_Mode

    394
  • SCXI_Set_State

    395
  • SCXI_Set_Threshold

    397
  • SCXI_Single_Chan_Setup

    399
  • SCXI_Track_Hold_Control

    400
  • SCXI_Track_Hold_Setup

    401
  • Select_Signal

    405
  • Set_DAQ_Device_Info

    422
  • Timeout_Config

    433
  • WFM_Chan_Control

    435
  • WFM_Check

    437
  • WFM_ClockRate

    439
  • WFM_DB_Config

    444
  • WFM_DB_HalfReady

    446
  • WFM_DB_Transfer

    448
  • WFM_from_Disk

    450
  • WFM_Group_Control

    453
  • WFM_Group_Setup

    456
  • WFM_Load

    458
  • WFM_Op

    467
  • WFM_Rate

    470
  • WFM_Scale

    472
  • WFM_Set_Clock

    474
• Appendix A Status Codes

  476
• Appendix B Analog Input Channel, Gain Settings, and Voltage C...

  499
  • DAQ Device Analog Input Channel Settings

    499
  • Valid Internal Analog Input Channels

    500
  • DAQ Device Gain Settings

    503
  • Voltage Calculation

    503
  • Offset and Gain Adjustment

    505
    • Measurement of Offset

      505
    • Measurement of Gain Adjustment

      505
• Appendix C NI-DAQ Function Support

  506
• Appendix D Customer Communication

  523
  • Electronic Services

    523
  • Telephone and Fax Support

    524
  • Technical Support Form

    525
  • NI-DAQ for PC Compatibles Hardware and Software Co...

    526
    • National Instruments Products

      526
    • Other Products

      526
  • Documentation Comment Form

    527
• Glossary

  528
  • Numbers/Symbols

    528
  • A

    528
  • B

    529
  • C-D

    530
  • E-H

    532
  • I

    533
  • K-M

    534
  • N

    535
  • O-P

    536
  • R

    537
  • S

    538
  • T-U

    539
  • V-X

    540
• Index

  541
  • Numbers

    541
  • A

    541
  • B

    542
  • C

    543
  • D

    545
  • E

    546
  • F-G

    547
  • H-L

    548
  • M

    549
  • N-S

    550
  • T-W

    553
• Figures

  8
  • Figure 2-1. High Alarm Deadband

    98
  • Figure 2-2. Low Alarm Deadband

    99
  • Figure 2-3. Analog Trigger Event

    103
  • Figure 2-4. ND_BELOW_LOW_LEVEL

    118
  • Figure 2-5. ND_ABOVE_HIGH_LEVEL

    118
  • Figure 2-6. ND_INSIDE_REGION

    118
  • Figure 2-7. ND_HIGH_HYSTERESIS

    119
  • Figure 2-8. ND_LOW_HYSTERESIS

    119
  • Figure 2-9. Pulse Generation Timing

    135
  • Figure 2-10. Pulse Timing for pulseWidth = 0

    136
  • Figure 2-11. Square Wave Timing

    145
  • Figure 2-12. Digital Scanning Input Group Handshak...

    223
  • Figure 2-13. Digital Scanning Output Group Handsha...

    224
  • Figure 2-14. Simple Event Counting

    250
  • Figure 2-15. Single Period Measurement

    252
  • Figure 2-16. Single Pulse Width Measurement

    254
  • Figure 2-17. Single Triggered Pulse Width Generati...

    257
  • Figure 2-18. Start-Stop Measurement

    259
  • Figure 2-19. Single Pulse Generation

    261
  • Figure 2-20. Single Triggered Pulse Generation

    263
  • Figure 2-21. Retriggerable Pulse Generation

    265
  • Figure 2-22. Pulse Train Generation

    266
  • Figure 2-23. Frequency Shift Keying

    268
  • Figure 2-24. Buffered Event Counting

    269
  • Figure 2-25. Buffered Period Measurement

    271
  • Figure 2-26. Buffered Period Measurement when No S...

    272
  • Figure 2-27. Buffered Semi-Period Measurement when...

    272
  • Figure 2-28. Buffered Semi-Period Measurement when...

    273
  • Figure 2-29. Buffered Pulse Width Measurement

    274
  • Figure 2-30. Buffered Pulse Width when Gate Is Hig...

    274
  • Figure 2-31. Buffered Two Signal Edge Separation M...

    276
  • Figure 2-32. Mode 0 Timing Diagram

    285
  • Figure 2-33. Mode 1 Timing Diagram

    285
  • Figure 2-34. Mode 2 Timing Diagram

    285
  • Figure 2-35. Mode 3 Timing Diagram

    286
  • Figure 2-36. Mode 4 Timing Diagram

    286
  • Figure 2-37. Mode 5 Timing Diagram

    286
• Tables

  9
  • Table 1. MIO and AI Devices

    16
  • Table 1-1. Status Values

    20
  • Table 1-2. Primary Type Names

    21
  • Table 1-3. The LabWindows/CVI Function Tree for Da...

    25
  • Table 2-1. Parameter Settings for AI_Configure

    40
  • Table 2-2. Port 0 Digital I/O Lines Reserved

    44
  • Table 2-3. Reglitching Parameters for Permissible ...

    61
  • Table 2-4. Voltage or Current Output Parameters

    62
  • Table 2-5. Parameter Values for FIFO Transfer Cond...

    62
  • Table 2-6. Default Values for FIFO Transfer Condit...

    63
  • Table 2-7. Parameter Setting Information for the A...

    64
  • Table 2-8. Parameter Setting Information for the D...

    64
  • Table 2-9. Parameter Setting Information for Outpu...

    65
  • Table 2-10. Parameter Setting Information for Outp...

    65
  • Table 2-11. Parameter Setting Information for Outp...

    66
  • Table 2-12. Parameter Setting Information for Freq...

    67
  • Table 2-13. Parameter Setting Information for the ...

    68
  • Table 2-14. Parameter Setting Information for PLL ...

    68
  • Table 2-15. Parameter Setting Information for the ...

    69
  • Table 2-16. Possible Calibrate_1200 Parameter Valu...

    84
  • Table 2-17. DAQEvent Messages

    107
  • Table 2 -18. Valid Counters and External Timing Sig...

    111
  • Table 2-19. Usable Parameters for Different DAQ Ev...

    112
  • Table 2-20. Legal Values for gpctrNum Parameter

    232
  • Table 2-21. Legal Values for paramValue when param...

    232
  • Table 2-22. Definition of Other Counter for paramV...

    233
  • Table 2-23. Default Source Selection for ND_SIMPLE...

    233
  • Table 2-24. Legal Values for paramValue when param...

    236
  • Table 2-25. Default Gate Selection

    237
  • Table 2-26. Default Second Gate Selection

    238
  • Table 2-27. Legal Values for paramValue when param...

    239
  • Table 2-28. Legal Values for paramValue when param...

    239
  • Table 2-29. Default Up/Down Selection

    240
  • Table 2-30. Legal Values for the action Parameter

    244
  • Table 2-31. Descriptions for application

    249
  • Table 2-32. Terminal Count

    251
  • Table 2-33. SCXI Module Scan List

    381
  • Table 2-34. MIO or AI Scan List

    381
  • Table 2-35. Possible Values for signal

    407
  • Table 2-36. Legal Parameters for the 6602 Devices

    418
  • Table 2-37. E Series Signal Name Equivalencies

    420
  • Table 2-38. RTSI Bus Line and VXIbus Trigger Mappi...

    420
  • Table 2-39. Data Ranges for the Buffer Parameter f...

    459
  • Table 2-40. Mode Values for the Count Parameter fo...

    460
  • Table 2-41. Mode Values for the Iterations Paramet...

    461
  • Table 2-42. Array Structures for DDS Mode

    463
  • Table 2-43. Array Structures for ARB Mode

    464
  • Table A-1. Status Code Summary

    476
  • Table B-1. Valid Analog Input Channel Settings

    499
  • Table B-2. Valid Internal Analog Input Channels

    500
  • Table B-3. Internal Channel Purposes for Analog In...

    502
  • Table B-4. Valid Gain Settings

    503
  • Table B-5. The Values of maxReading and maxVolt

    504
  • Table C-1. MIO and AI Device Functions

    506
  • Table C-2. Lab/516/DAQCard-500/700 Functions

    511
  • Table C-3. DSA Device Functions

    514
  • Table C-4. Analog Output Family Functions

    516
  • Table C-5. Digital I/O Family Functions

    517
  • Table C-6. Timing Device Functions

    519
  • Table C-7. SCXI Functions

    521