Cypress STK11C68 Manuale Utente

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STK11C68
Document Number: 001-50638 Rev. **
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AC Switching Characteristics 
SRAM Read Cycle
Parameter
Description
25 ns 
35 ns 
45 ns 
Unit
Min
Max
Min
Max
Min
Max
Cypress
Parameter
Alt
t
ACE
t
ELQV
Chip Enable Access Time
25
35
45
ns
t
RC 
t
AVAV, 
t
ELEH
Read Cycle Time
25
35
45
ns
t
AA 
[5]
t
AVQV
Address Access Time
25
35
45
ns
t
DOE
t
GLQV
Output Enable to Data Valid
10
15
20
ns
t
OHA 
[5]
t
AXQX
Output Hold After Address Change
5
5
5
ns
t
LZCE 
t
ELQX
Chip Enable to Output Active
5
5
5
ns
t
HZCE 
t
EHQZ
Chip Disable to Output Inactive
10
13
15
ns
t
LZOE 
[6]
t
GLQX
Output Enable to Output Active
0
0
0
ns
t
HZOE 
[6]
t
GHQZ
Output Disable to Output Inactive
10
13
15
ns
t
PU 
[3]
t
ELICCH
Chip Enable to Power Active
0
0
0
ns
t
PD 
[3]
t
EHICCL
Chip Disable to Power Standby
25
35
45
ns
Switching Waveforms
Figure 5.  SRAM Read Cycle 1: Address Controlled 
Figure 6.  SRAM Read Cycle 2: CE and OE Controlled 
W
5&
W
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W
2+$
$''5(66
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$''5(66
W
5&
&(
W
$&(
W
/=&(
W
3'
W
+=&(
2(
W
'2(
W
/=2(
W
+=2(
'$7$9$/,'
$&7,9(
67$1'%<
W
38
'4'$7$287
,&&
Notes
4. WE must be High during SRAM Read cycles.
5. I/O state assumes CE and OE < V
IL
 and WE > V
IH
; device is continuously selected.
6. Measured ±200 mV from steady state output voltage.