Samsung MZMPC128HBFU-00000 Manuale Utente

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        datasheet

When the value in the LBA Low register is 4 or 132, the Selective self-test routine shall be performed. This selftest routine shall include the initial tests per-
formed by the Extended self-test routine plus a selectable read scan. The host shall not write the Selective self-test log while the execution of a Selective 
self-test command is in progress.

The user may choose to do read scan only on specific areas of the media. To do this, user shall set the test spans desired in the Selective self-test log and 
set the flags in the Feature flags field of the Selective self-test log to indicate do not perform off-line scan. In this case, the test spans defined shall be read 
scanned in their entirety. The Selective self-test log is updated as the self-test proceeds indicating test progress. When all specified test spans have been 
completed, the test is terminated and the appropriate self-test execution status is reported in the SMART READ DATA response depending on the occur-
rence of errors. Figure on page 21 shows an example of a Selective selftest definition with three test spans defined. In this example, the test terminates 
when all three test spans have been scanned.

After the scan of the selected spans described above, a user may wish to have the rest of media read scanned as an off-line scan. In this case, the user 
shall set the flag to enable off-line scan in addition to the other settings. If an error occurs during the scanning of the test spans, the error is reported in the 
self-test execution status in the SMART READ DATA response and the off-line scan is not executed. When the test spans defined have been scanned, 
the device shall then set the offline scan pending and active flags in the Selective self-test log to one, the span under test to a value greater than five, the 
self-test execution status in the SMART READ DATA response to 00h, set a value of 03h in the off-line data collection status in the SMART READ DATA 
response and shall proceed to do an off-line read scan through all areas not included in the test spans. This off-line read scan shall completed as rapidly 
as possible, no pauses between block reads, and any errors encountered shall not be reported to the host. Instead error locations may be logged for 
future reallocation. If the device is powered-down before the off-line scan is completed, the off-line scan shall resume when the device is again powered 
up. From power-up, the resumption of the scan shall be delayed the time indicated in the Selective self-test pending time field in the Selective self-test log. 
During this delay time the pending flag shall be set to one and the active flag shall be set to zero in the Selective self-test log. Once the time expires, the 
active flag shall be set to one, and the off-line scan shall resume. When the entire media has been scanned, the off-line scan shall terminate, both the 
pending and active flags shall be cleared to zero, and the off-line data collection status in the SMART READ DATA response shall be set to 02h indicating 
completion.

During execution of the Selective self-test, the self-test executions time byte in the Device SMART Data Structure may be updated but the accuracy may 
not be exact because of the nature of the test span segments. For this reason, the time to complete off-line testing and the self-test polling times are not 
valid. Progress through the test spans is indicated in the selective self-test log.

A hardware or software reset shall abort the Selective self-test except when the pending bit is set to one in the Selective self-test log (see 7.3.7). The 
receipt of a SMART EXECUTE OFF-LINE IMMEDIATE command with 0Fh, Abort off-line test routine, in the LBA Low register shall abort Selective self-
test regardless of where the device is in the execution of the command. If a second self-test is issued while a selective self-test is in progress, the selec-
tive self-test is aborted and the newly requested self-test is executed.