IBM 00AE867 Manuale Utente
IBM Flash Adapters Enterprise Value for System x
4
Technical specifications
Table 2 presents the technical specifications for the IBM Flash Adapters Enterprise Value.
Table 2. IBM High IOPS MLC Adapter technical specifications
Specification
825 GB
1650 GB
3200 GB
Part number
00AE861
00AE864
00AE867
Interface
PCIe 2.0 x4
PCIe 2.0 x4
PCIe 2.0 x8 (x4-wired)
Form factor
Half height, half length
Half height, half length
Full height, half length
Capacity
825 GB
1650 GB
3200 GB
Endurance
4 PB TBW
8 PB TBW
20 PB TBW
Random read IOPS (512 bytes blocks)
135,000
144,000
115,000
Random write IOPS (512 bytes blocks)
535,000
535,000
535,000
Random read IOPS (4 KB blocks)
130,000
130,000
115,000
Random write IOPS (4 KB blocks)
235,000
235,000
243,000
Sequential read rate (1 MB blocks)
1.4 GBps
1.4 GBps
1.5 GBps
Sequential write rate (1 MB blocks)
1.1 GBps
1.1 GBps
1.3 GBps
Read access latency
77 μs
77 μs
92 μs
Write access latency
19 μs
19 μs
19 μs
Power requirements
25 W max
25 W max
25 W max
The TBW (total bytes written) value assigned to a solid-state device is the total bytes of written data
(based on the number of P/E cycles) that a device can be guaranteed to complete (the percentage of
remaining P/E cycles is equal to the percentage of remaining TBW). The IBM warranty for the solid-state
storage is limited to devices that have not reached the maximum guaranteed number of program/erase
cycles. Solid-state storage that reaches this limit might fail to operate according to its specifications.
Because of such behavior by solid-state devices, careful planning must be done to use solid-state storage
in the application environments to ensure that the TBW of the device is not exceeded before the end of
the required life expectancy.
(based on the number of P/E cycles) that a device can be guaranteed to complete (the percentage of
remaining P/E cycles is equal to the percentage of remaining TBW). The IBM warranty for the solid-state
storage is limited to devices that have not reached the maximum guaranteed number of program/erase
cycles. Solid-state storage that reaches this limit might fail to operate according to its specifications.
Because of such behavior by solid-state devices, careful planning must be done to use solid-state storage
in the application environments to ensure that the TBW of the device is not exceeded before the end of
the required life expectancy.
Writes are tracked and reported by the adapter's management utility and might be affected by application
writes, data patterns, and maintenance designed to maximize data integrity.
writes, data patterns, and maintenance designed to maximize data integrity.