Acer E3-1220 v3 KC.12201.3E3 Manuale Utente

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KC.12201.3E3
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Symbol
Definition and Conditions
Min
Max
Units
Notes
1
V
n
Negative-Edge Threshold
Voltage
0.275 *
V
CCIO_TERM
0.500
* V
CCIO_TERM
V
V
p
Positive-Edge Threshold
Voltage
0.550 *
V
CCIO_TERM
0.725 *
V
CCIO_TERM
V
C
bus
Bus Capacitance per Node
N/A
10
pF
C
pad
Pad Capacitance
0.7
1.8
pF
Ileak000
leakage current at 0 V
0.6
mA
Ileak025
leakage current at 0.25*
V
CCIO_TERM
0.4
mA
Ileak050
leakage current at 0.50*
V
CCIO_TERM
0.2
mA
Ileak075
leakage current at 0.75*
V
CCIO_TERM
0.13
mA
Ileak100
leakage current at
V
CCIO_TERM
0.10
mA
Notes: 1. V
CCIO_TERM
 supplies the PECI interface. PECI behavior does not affect V
CCIO_TERM
 minimum /
maximum specifications.
2. The leakage specification applies to powered devices on the PECI bus.
3. The PECI buffer internal pull-up resistance measured at 0.75* V
CCIO_TERM
 .
7.8.2 
Input Device Hysteresis
The input buffers in both client and host models must use a Schmitt-triggered input
design for improved noise immunity. Use the following figure as a guide for input
buffer design.
Figure 19.
Input Device Hysteresis
Minimum V
P
Maximum V
P
Minimum V
N
Maximum V
N
PECI High Range
PECI Low Range
Valid Input
Signal Range
Minimum
Hysteresis
V
TTD
PECI Ground
Processor—Electrical Specifications
Intel
®
 Xeon
®
 Processor E3-1200 v3 Product Family
Datasheet – Volume 1 of 2
June 2013
100
Order No.: 328907-001