Fujifilm Xeon 5060 S26361-F3312-L320 Scheda Tecnica
Codici prodotto
S26361-F3312-L320
Electrical Specifications
36
Dual-Core Intel
®
Xeon
®
Processor 5100 Series Datasheet
Notes:
1.
VOS is the measured overshoot voltage.
2.
TOS is the measured time duration above VID.
2.13.2
Die Voltage Validation
Core voltage (VCC) overshoot events at the processor must meet the specifications in
when measured across the VCC_DIE_SENSE and VSS_DIE_SENSE lands
and across the VCC_DIE_SENSE2 and VSS_DIE_SENSE2 lands. Overshoot events that
are < 10 ns in duration may be ignored. These measurements of processor die level
overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.
are < 10 ns in duration may be ignored. These measurements of processor die level
overshoot should be taken with a 100 MHz bandwidth limited oscilloscope.
§
Figure 2-7. V
CC
Overshoot Example Waveform
Example Overshoot Waveform
0
5
10
15
20
25
Time [us]
Vo
ltag
e [V]
VID - 0.000
VID + 0.050
V
OS
T
OS
T
OS
: Overshoot time above VID
V
OS
: Overshoot above VID