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AFE7222EVM
User's Guide
SLOU362 – February 2013
AFE722x Evaluation Module (AFE722xEVM) User's Guide
The AFE722x EVM includes a great level of flexibility enabling testing in a more system-like environment.
The individual power rails can be generated through LDOs or DC/DC converters from a 6-V power source
and the EVM clock architecture allows for external clock input as well as clock generation using a low-jitter
PLL in combination with a VCXO. On the transmit side, the EVM provides the option of connecting directly
to the DAC outputs or perform up-conversion via an on-board IQ modulator.
The individual power rails can be generated through LDOs or DC/DC converters from a 6-V power source
and the EVM clock architecture allows for external clock input as well as clock generation using a low-jitter
PLL in combination with a VCXO. On the transmit side, the EVM provides the option of connecting directly
to the DAC outputs or perform up-conversion via an on-board IQ modulator.
On the digital side, the EVM provides a seamless interface to the TSW1400 and TSW1405 capture card in
order to evaluate received data directly on a PC. The TSW1400 and TSW1406 pattern generation card
can be used to provide data to the dual DAC of the AFE722x and the on board, CDCE72010 generates
the appropriate clock for the TSW1400 and TSW1406 for synchronous operation. Both the AFE722x and
CDCE72010 can be programmed via SPI, conveniently, through the USB connection.
order to evaluate received data directly on a PC. The TSW1400 and TSW1406 pattern generation card
can be used to provide data to the dual DAC of the AFE722x and the on board, CDCE72010 generates
the appropriate clock for the TSW1400 and TSW1406 for synchronous operation. Both the AFE722x and
CDCE72010 can be programmed via SPI, conveniently, through the USB connection.
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SLOU362 – February 2013
AFE722x Evaluation Module (AFE722xEVM) User's Guide
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