Samsung RAM DDR2 2GB, PC800 M378T5663DZ3-CF7 Dépliant

Codici prodotto
M378T5663DZ3-CF7
Pagina di 2
M378T5663DZ3-CF7
Used component part #
:K4T1G084QD-ZCF7
# of banks in component
:8 banks
Bin Sort : F7(DDR2-800@CL=6)
Contents : 
Byte #
Function described
Function Supported
CF7
Hex Value
CF7
Note
0
# of Serial PD Bytes written during module production
1
128bytes
80h
1
Total Number of SPD memory device
2
256bytes(2k bit)
08h
2
Fundameatal memory type
DDR2 SDRAM
08h
3
# of row address on this assembly
14
0Eh
4
# of column address on this assembly
10
0Ah
5
# of module rows on this assembly
2 Row, Planar, 30.0mm
61h
6
Data width of this assembly
64bits
40h
7
Reserved
-
00h
8
Voltage interface level of this assembly
SSTL 1.8V
05h
9
DDR2 SDRAM cycle time at Max. Supported CAS latency=X
3
2.5ns
25h
10
DDR2 SDRAM Access time from clock at CL=X
+/-0.40ns
40h
11
DIMM configuration type (address&command parity, data parity,
ECC)
Non parity/ECC
00h
12
Refresh rate
3,4
7.8us
82h
13
Primary DDR2 SDRAM width
x8
08h
14
Error checking DDR2 SDRAM data width
N/A
00h
15
Reserved
-
00h
16
DDR2 SDRAM device attributes : Burst lengths supported
4,8
0Ch
17
DDR2 SDRAM device attributes : # of banks on each DDR2 SDRAM
device
3
8 banks
08h
18
DDR2 SDRAM device attributes : CAS latency supported
6,5,4
70h
19
DIMM Mechanical Characteristics
X =< 4.10
01h
20
DIMM type information
3
Regular UDIMM
02h
21
DDR2 SDRAM module attributes
Analysis probe not installed, FET switch
external not enable
00h
22
DDR2 SDRAM device attributes : General
Supports weak driver, 50Ohm ODT, PASR
07h
23
DDR2 SDRAM cycle time at CL= X-1
3.0ns
30h
24
DDR2 SDRAM access time from clock at CL= X-1
+/- 0.45ns
45h
25
DDR2 SDRAM cycle time at CL= X-2
3.75ns
3Dh
26
DDR2 SDRAM access time from clock at CL= X-2
+/-0.5ns
50h
27
Minimum row precharge time(=tRP)
15ns
3Ch
28
Minimum row active to row active delay(=tRRD)
3
7.5ns
1Eh
29
Minimum RAS to CAS delay(=tRCD)
15ns
3Ch
30
Minimum active  precharge time(=tRAS)  
45ns
2Dh
31
Module rank density
1GB
01h
32
Command and address setup time before clock(=tIS)
3
0.17ns
17h
33
Command and address hold time after clock(=tIH)
3
0.25ns
25h
34
Data input setup time before strobe(=tDS)
3
0.05ns
05h
35
Data input hold time after strobe(=tDH)
3
0.12ns
12h
36
Write recovery time(=tWR)
3
15ns
3Ch
37
Internal write to read command delay(=tWTR)
3
7.5ns
1Eh
38
Internal read to precharge command delay(=tRTP)
3
7.5ns
1Eh
39
Memory analysis probe characteristics
-
00h
SERIAL PRESENCE DETECT
DEC. 2006