Teledyne Microscope & Magnifier 100E Manuale Utente

 

Walking across nylon carpet 

1,500V 

35,000V 

Walking across vinyl tile 

250V 

12,000V 

Worker at bench 

100V 

6,000V 

Poly bag picked up from bench 

1,200V 

20,000V 

Moving around in a chair padded 
with urethane foam 

1,500V 18,000V 

13.2. HOW ELECTRO-STATIC CHARGES CAUSE DAMAGE 

Damage to components occurs when these static charges come into contact with an electronic device.  Current 
flows as the charge moves along the conductive circuitry of the device and the typically very high voltage levels of 
the charge overheat the delicate traces of the integrated circuits, melting them or even vaporizing parts of them.  
When examined by microscope the damage caused by electro-static discharge looks a lot like tiny bomb craters 
littered across the landscape of the component’s circuitry. 

A quick comparison of the values in Table 13-1 with the those shown in the Table 13-2, listing device susceptibility 
levels, shows why Semiconductor Reliability News estimates that approximately 60% of device failures are the 
result of damage due to electro-static discharge. 

MOSFET 10 

100 

VMOS 30 

1800 

NMOS 60 

100 

GaAsFET 60 

2000 

EPROM 100 

100 

JFET 140 

7000 

SAW 150 

500 

Op-AMP 190 

2500 

CMOS 200 

3000 

Schottky Diodes 

300 

2500 

Film Resistors 

300 

3000 

This Film Resistors 

300 

7000 

ECL 500 

500 

SCR 500 

1000 

Schottky TTL 

500 

2500 

04515F DCN6048