Hitachi Microscope & Magnifier S-4800 Manuale Utente
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button and click the Direct Photo
or Memory Photo
button. Recommended
procedures for taking a photograph is;
① Observe an image in Position Set mode at Slow3 or slower scanning speeds. Click
the Line Analysis button when the scanning raster reaches the bottom of the
screen.
screen.
② Set the line cursor at an analyzing position. Adjust the base line (in case of SE or
BSE, adjust brightness) and the height (in case of SE or BSE, adjust contrast and
in case of X-ray, adjust the count-rate meter range) of the profile. Then stop the
scanning.
in case of X-ray, adjust the count-rate meter range) of the profile. Then stop the
scanning.
③ Click on Memory Photo button.
The signal for line profile can be selected independent of the signal for image. For
example, you can observe or take a photograph of an X-ray intensity line profile on the
secondary electron image. To select a signal for the line profile, use the LINE
PROFILE SIGNAL block on the Setup dialog window – Image tab.
The signal for line profile can be selected independent of the signal for image. For
example, you can observe or take a photograph of an X-ray intensity line profile on the
secondary electron image. To select a signal for the line profile, use the LINE
PROFILE SIGNAL block on the Setup dialog window – Image tab.
(3)
Spot Analysis mode
Stops the scanning and places the electron beam at a specified point on the image. Used for
X-ray analysis of a point on the specimen.
The Spot Analysis button is used for two scanning modes as follows.
X-ray analysis of a point on the specimen.
The Spot Analysis button is used for two scanning modes as follows.
(a) Position Set mode for Spot Analysis
Upon the first click of the button in other scanning modes or in Spot Analysis mode, a
Cross-hair cursor is overlaid on the image. The cross point of the cursor corresponds to
a position where the electron beam is positioned in Spot Analysis mode. To select a
position of the cursor, locate the mouse icon near the cross point. When the mouse
cursor is changed to an intersecting arrow mark
Cross-hair cursor is overlaid on the image. The cross point of the cursor corresponds to
a position where the electron beam is positioned in Spot Analysis mode. To select a
position of the cursor, locate the mouse icon near the cross point. When the mouse
cursor is changed to an intersecting arrow mark
, drag the cursor with the mouse
holding down the left button.
(b) Spot Analysis mode
When the Spot Analysis button is clicked in Position Set mode, the scanning image is
frozen and the electron beam is positioned at the cross point of the cursor. You can
make analysis of this point.
The cursor can also be moved in this mode with the same operation as above. The
Run/Stop button and Scanning Speed buttons are disabled in this mode.
To take a photograph with the cross-hair cursor, go to Direct Photo recording or Memory
Photo recording in Position Set mode.
frozen and the electron beam is positioned at the cross point of the cursor. You can
make analysis of this point.
The cursor can also be moved in this mode with the same operation as above. The
Run/Stop button and Scanning Speed buttons are disabled in this mode.
To take a photograph with the cross-hair cursor, go to Direct Photo recording or Memory
Photo recording in Position Set mode.
(4)
Area Analysis mode
Scans the electron beam in a selected frame in the image. Used for X-ray analysis of a