IBM 09-0572-000 Manuale Utente
7-4
C
HAPTER
7: T
ROUBLESHOOTING
Diagnostic Test Types
The tests performed by the TokenDisk diskette Configuration
and Diagnostic Program are divided into Group 1 and
Group 2 tests.
and Diagnostic Program are divided into Group 1 and
Group 2 tests.
A lobe cable must be connected from the selected adapter to
a retiming concentrator or MAU for all tests.
a retiming concentrator or MAU for all tests.
Group 1 Diagnostics
Group 1 diagnostics test physical components, connectors,
and circuitry of the adapter. They include the following tests:
and circuitry of the adapter. They include the following tests:
■
MMIO Register Write/Read Test
■
Boot PROM Test (if the Boot PROM is enabled)
■
AIP Checksum Test
■
Shared RAM Boundary/Domain Test
■
Shared RAM Write/Read Test
■
Timer Test
■
Open Adapter for Ring Operation Test
■
Ring Operations Test
■
Close Adapter Test
Each of these tests is explained in more detail below.
MMIO Register Write/Read Test
This test verifies that the PC can access the adapter’s memory
mapped I/O registers correctly.
mapped I/O registers correctly.
Boot PROM Test
This test verifies that the PC can access the Boot PROM
correctly and verifies the integrity of the Boot PROM.
correctly and verifies the integrity of the Boot PROM.