Seagate ST100FP0001 ユーザーズマニュアル
S
EAGATE
600 P
RO
SSD P
RODUCT
M
ANUAL
, R
EV
. A
16
2.11 R
ELIABILITY
2.11.1 Annualized Failure Rate (AFR) and Mean Time Between Failures (MTBF)
The product shall achieve an Annualized Failure Rate - AFR - of 0.58%. AFR and MTBF are population statistics that are not
relevant to individual units.
relevant to individual units.
AFR and MTBF specifications are based on the following assumptions:
• 8760 power-on-hours per year.
• 250 average power cycles per year.
• Operations at nominal voltages.
• Systems will provide adequate cooling to ensure the case temperatures do not exceed specification.
• 250 average power cycles per year.
• Operations at nominal voltages.
• Systems will provide adequate cooling to ensure the case temperatures do not exceed specification.
2.11.2 Reliability specifications
Unrecoverable read error rate during
1 LBA per 10
16
bits read, max
Annualized Failure Rate (AFR)
0.58%
Power cycles
25,000 cycles
(at nominal voltage and temperature, with 60 cycles per hour
and a 50% duty cycle)
(at nominal voltage and temperature, with 60 cycles per hour
and a 50% duty cycle)
Warranty
Warranty terms will vary based on type of warranty chosen:
“Managed Life”
“Managed Life”
Consult your Seagate
sales representative for warranty terms and conditions.
Preventive maintenance
None required.
Typical Data Retention with Power removed (at 40°C)
Endurance
Method 1: 2 Drive Writes per Day
Method 2: TBW (per JEDEC JESD218)
400GB = 834TB
200GB = 417TB
100GB = 209TB
[1]
As NAND Flash devices age with use, the capability of the media to retain a programmed value begins to
deteriorate. This deterioration is affected by the number of times a particular memory cell is programmed
and subsequently erased. When a device is new, it has a powered off data retention capability of up to ten
years. With use the retention capability of the device is reduced. Temperature also has an effect on how long
a Flash component can retain its programmed value with power removed. At high temperature the retention
capabilities of the device are reduced. Data retention is not an issue with power applied to the SSD. The
SSD drive contains firmware and hardware features that can monitor and refresh memory cells when power
is applied.
deteriorate. This deterioration is affected by the number of times a particular memory cell is programmed
and subsequently erased. When a device is new, it has a powered off data retention capability of up to ten
years. With use the retention capability of the device is reduced. Temperature also has an effect on how long
a Flash component can retain its programmed value with power removed. At high temperature the retention
capabilities of the device are reduced. Data retention is not an issue with power applied to the SSD. The
SSD drive contains firmware and hardware features that can monitor and refresh memory cells when power
is applied.
[2]
Endurance is the expected write life of a product when subjected to a specified workload. The drive will sup-
port the end user writing the specified multiple of drive user capacity to the drive per day for the expected life
of the product. This value is based on randomly writing 4KB transfers aligned on 4KB boundaries across the
entire drive LBA range. For example a 200GB drive could be written to up to (n*200GB) of user data per day
for the product life.
port the end user writing the specified multiple of drive user capacity to the drive per day for the expected life
of the product. This value is based on randomly writing 4KB transfers aligned on 4KB boundaries across the
entire drive LBA range. For example a 200GB drive could be written to up to (n*200GB) of user data per day
for the product life.
[3]
Managed Life Warranty: This warranty is term based and includes the Lifetime Endurance Management fea-
ture stated in Section 2.4.1.
ture stated in Section 2.4.1.
[4]
Usage Based Warranty: This warranty is based on the shorter of term and endurance usage of the drive.
[5]
The AFR and MTBF specifications for the drive assumes the operating environment is designed to maintain
nominal internal temperature. The rated AFR is based upon a sustained internal temperature of 60°C. Occa-
sional excursions in operating temperature between the rated MTBF temperature and the maximum drive
operating temperature may occur without impact to the rated MTBF temperature. However continual or sus-
tained operation at temperatures beyond the rated MTBF temperature will degrade the drive MTBF and
reduce product reliability
nominal internal temperature. The rated AFR is based upon a sustained internal temperature of 60°C. Occa-
sional excursions in operating temperature between the rated MTBF temperature and the maximum drive
operating temperature may occur without impact to the rated MTBF temperature. However continual or sus-
tained operation at temperatures beyond the rated MTBF temperature will degrade the drive MTBF and
reduce product reliability