Seagate ST100FX0002 ユーザーズマニュアル

14

Pulsar XT.2 SAS Product Manual, Rev. B

The following reliability specifications assume correct host and drive operational interface, including all inter-
face timings, power supply voltages, environmental requirements and drive mounting constraints.  

The error rates stated in this manual assume the following:

• The drive is operated in accordance with this manual using DC power as defined in paragraph 7.3, "DC 

• Errors caused by host system failures are excluded from error rate computations.
• Assume random data.
• Default OEM error recovery settings are applied. This includes AWRE, ARRE, full read retries, full write 

retries and full retry time.

Read Error Rates 

1

1. Error rate specified with automatic retries and data correction with ECC enabled and all flaws reallocated.
2. As NAND Flash devices age with use, the capability of the media to retain a programmed value begins to deteriorate. 

This deterioration is affected by the number of times a particular memory cell is programmed and subsequently erased. 
When a device is new, it has a powered off data retention capability of up to several years. With use the retention ca-
pability of the device is reduced. Temperature also has an effect on how long a Flash component can retain its pro-
grammed value with power removed. At high temperature the retention capabilities of the device are reduced. Data 
retention is not an issue with power applied to the SSD. The SSD drive contains firmware and hardware features that 
can monitor and refresh memory cells when power is applied.

3. Endurance rating is the expected amount of host data that can be written by product when subjected to a specified work-

load at a specified operating and storage temperature. For the specific workload to achieve this level of endurance, 
please reference JEDEC Specification JESD218. TBW is defined as 1x10^12 Bytes.

Unrecovered Data

Less than 1 LBA in 10

16

 bits transferred

Miscorrected Data

Less than 1 LBA in 10

21

 bits transferred

Interface error rate:

Less than 1 error in 10

12

 bits transferred

Mean Time Between Failure (MTBF):

2,000,000 hours

Annualized Failure Rate (AFR):

0.44%

Preventive maintenance:

None required

Typical Data Retention with

 

Power removed (at 40C)  

2

3 months

Endurance Rating: 

Method 1: Full drive writes per day    35 

 

Method 2: TBW (per JEDEC JESD218      400GB = 24,800 TB
                                                                     200GB = 12,400 TB
                                                                     100GB = 6,200 TB