Seagate ST800FM0032 ユーザーズマニュアル

P

ULSAR

.2 SAS P

RODUCT 

M

ANUAL

, R

EV

. C

  15

  

Integrators can enhance the reliability of Pulsar.2 drives by ensuring that the drive receives adequate cooling. Section 6.0 provides 
temperature measurements and other information that may be used to enhance the service life of the drive. Section 10.2 provides 
recommended air-flow information.

The production drive shall achieve an AFR of 0.44% (MTBF of 2,000,000 hours) when operated in an environment that ensures the case 
temperatures do not exceed the values specified in Section 6.5. Operation at case temperatures outside the specifications in Section 6.5 
may increase the product AFR (decrease the MTBF). The AFR (MTBF) is a population statistic not relevant to individual units.

The AFR (MTBF) specification is based on the following assumptions for Enterprise Storage System environments:
• 8760 power-on hours per year.
• 250 average on/off cycles per year.
• Operations at nominal voltages.
• Systems will provide adequate cooling to ensure the case temperatures specified in Section 6.5 are not exceeded. Temperatures outside 

the specifications in Section 6.5 will increase the product AFR and decrease the MTBF.

No routine scheduled preventive maintenance is required.

When a drive is powered on by switching the power or hot plugged, the drive runs a self test before attempting to communicate on its’ 
interfaces. When the self test completes successfully, the drive initiates a Link Reset starting with OOB. An attached device should 
respond to the link reset. If the link reset attempt fails, or any time the drive looses sync, the drive initiated link reset. The drive will initiate 
link reset once per second but alternates between port A and B. Therefore each port will attempt a link reset once per 2 seconds assuming 
both ports are out of sync.

If the self-test fails, the drive does not respond to link reset on the failing port.

It is the responsibility of the systems integrator to assure that no temperature, energy, voltage hazard, or ESD potential hazard 
is presented during the hot connect/disconnect operation. Discharge the static electricity from the drive carrier prior to insert-
ing it into the system.

S.M.A.R.T. is an acronym for Self-Monitoring Analysis and Reporting Technology. This technology is intended to recognize conditions that 
indicate imminent drive failure and is designed to provide sufficient warning of a failure to allow administrators to back up the data before 
an actual failure occurs.

The drive’s firmware monitors specific attributes for degradation over time but can’t predict instantaneous drive failures.

Each monitored attribute has been selected to monitor a specific set of failure conditions in the operating performance of the drive and the 
thresholds are optimized to minimize “false” and “failed” predictions.

The operating mode of S.M.A.R.T. is controlled by the DEXCPT and PERF bits on the Informational Exceptions Control mode page (1Ch). 
Use the DEXCPT bit to enable or disable the S.M.A.R.T. feature. Setting the DEXCPT bit disables all S.M.A.R.T. functions. When enabled, 
S.M.A.R.T. collects on-line data as the drive performs normal read and write operations. When the PERF bit is set, the drive is considered 
to be in “On-line Mode Only” and will not perform off-line functions.

An application can measure off-line attributes and force the drive to save the data by using the REZERO UNIT command. Forcing 
S.M.A.R.T. resets the timer so that the next scheduled interrupt is in one hour.

An application can interrogate the drive through the host to determine the time remaining before the next scheduled measurement and 
data logging process occurs. To accomplish this, issue a LOG SENSE command to log page 0x3E. This allows applications to control 
when S.M.A.R.T. interruptions occur. Forcing S.M.A.R.T. with the REZERO UNIT command resets the timer.