Seagate ST400FM0103 ユーザーズマニュアル
Seagate 1200 SSD Product Manual, Rev. C
20
5.0
Reliability specifications
The following reliability specifications assume correct host and drive operational interface, including all interface timings,
power supply voltages, environmental requirements and drive mounting constraints.
power supply voltages, environmental requirements and drive mounting constraints.
Read Error Rates
1
1. Error rate specified with automatic retries and data correction with ECC enabled and all flaws reallocated.
2. As NAND Flash devices age with use, the capability of the media to retain a programmed value begins to deteriorate.
2. As NAND Flash devices age with use, the capability of the media to retain a programmed value begins to deteriorate.
This deterioration is affected by the number of times a particular memory cell is programmed and subsequently erased.
When a device is new, it has a powered off data retention capability of up to several years. With use the retention capa-
bility of the device is reduced. Temperature also has an effect on how long a Flash component can retain its programmed
value with power removed. At high temperature the retention capabilities of the device are reduced. Data retention is
not an issue with power applied to the SSD. The SSD drive contains firmware and hardware features that can monitor
and refresh memory cells when power is applied.
When a device is new, it has a powered off data retention capability of up to several years. With use the retention capa-
bility of the device is reduced. Temperature also has an effect on how long a Flash component can retain its programmed
value with power removed. At high temperature the retention capabilities of the device are reduced. Data retention is
not an issue with power applied to the SSD. The SSD drive contains firmware and hardware features that can monitor
and refresh memory cells when power is applied.
3. Endurance rating is the expected amount of host data that can be written by product when subjected to a specified work-
load at a specified operating and storage temperature over the specified product life. For the specific workload to achieve
this level of endurance, please reference JEDEC Specification JESD218. TBW is defined as 1x10
this level of endurance, please reference JEDEC Specification JESD218. TBW is defined as 1x10
12
Bytes.
4. Limited Warranty with Media Usage provides coverage for the warranty period or until the SSD Percentage Used
Unrecovered Data
Less than 1 LBA in 10
16
bits transferred
Miscorrected Data
Less than 1 LBA in 10
21
bits transferred
Interface error rate:
Less than 1 error in 10
12
bits transferred
Mean Time Between Failure (MTBF): 2,000,000 hours
Annualized Failure Rate (AFR):
0.44%
Preventive maintenance:
None required
Typical Data Retention with
Power removed (at 40C)
Power removed (at 40C)
2
3 months
Method 1: Full drive writes per day 10 (all standard models)
25 (only High Endurance models)
25 (only High Endurance models)
Method 2: TBW (per JEDEC JESD218
)
ST400FM0093, ST400FM0103 = 18,250 TB
ST400FM0113, ST400FM0123 = 18,250 TB
ST800FM0013, ST800FM0023, ST800FM0033 = 14,600 TB
ST800FM0043, ST800FM0053, ST800FM0063 = 14,600 TB
ST800FM0043, ST800FM0053, ST800FM0063 = 14,600 TB
ST200FM0093, ST200FM0103 = 9125 TB
ST200FM0113, ST200FM0123 = 9125 TB
ST400FM0013, ST400FM0023, ST400FM0033 = 7300 TB
ST400FM0043, ST400FM0053, ST400FM0063 = 7300 TB
ST400FM0043, ST400FM0053, ST400FM0063 = 7300 TB
ST400FM0073, ST400FM0083 = 7300 TB
ST100FM0093, ST100FM0103 = 4562.5 TB
ST100FM0113, ST100FM0123 = 4562.5 TB
ST200FM0013, ST200FM0023, ST200FM0033 = 3650 TB
ST200FM0043, ST200FM0053, ST200FM0063 = 3650 TB
ST200FM0043, ST200FM0053, ST200FM0063 = 3650 TB
ST200FM0073, ST200FM0083 = 3650 TB