Seagate ST400FM0103 ユーザーズマニュアル

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Seagate 1200 SSD Product Manual, Rev. C
  46
  
c. Non-operating
The limits of non-operating vibration shall apply to all conditions of handling and transportation. This includes both iso-
lated drives and integrated drives.
The drive shall not incur physical damage or degraded performance as a result of vibration.
Vibration may be applied in the X, Y, or Z axis.
Non-operating translational random shaped profile
20 - 2000 Hz 
11.08 GRMS
6.5.5
Air cleanliness
The drive is designed to operate in a typical office environment with minimal environmental control.
6.5.6
Corrosive environment
Seagate electronic drive components pass accelerated corrosion testing equivalent to 10 years exposure to light industrial 
environments containing sulfurous gases, chlorine and nitric oxide, classes G and H per ASTM B845. However, this 
accelerated testing cannot duplicate every potential application environment.
Users should use caution exposing any electronic components to uncontrolled chemical pollutants and corrosive chemicals 
as electronic drive component reliability can be affected by the installation environment. The silver, copper, nickel and gold 
films used in Seagate products are especially sensitive to the presence of sulfide, chloride, and nitrate contaminants. Sulfur 
is found to be the most damaging. Materials used in cabinet fabrication, such as vulcanized rubber, that can outgas corrosive 
compounds should be minimized or eliminated. The useful life of any electronic equipment may be extended by replacing 
materials near circuitry with sulfide-free alternatives.
Seagate recommends that data centers be kept clean by monitoring and controlling the dust and gaseous contamination. 
Gaseous contamination should be within ANSI/ISA S71.04-2013 G2 classification levels (as measured on copper and silver 
coupons ),  and dust contamination to ISO 14644-1 Class 8 standards, and MTBF rated conditions as defined in the 
Annualized Failure Rate (AFR) and Mean Time Between Failure (MTBF) section.
6.5.7
Electromagnetic susceptibility