Motorola MC9S12GC-Family ユーザーズマニュアル

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All ESD testing is in conformity with CDF-AEC-Q100 Stress test qualification for Automotive Grade
Integrated Circuits. During the device qualification ESD stresses were performed for the Human Body
Model (HBM), the Machine Model (MM) and the Charge Device Model.

A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device
specification. Complete DC parametric and functional testing is performed per the applicable device
specification at room temperature followed by hot temperature, unless specified otherwise in the device
specification.

This chapter describes the operating conditions of the devices. Unless otherwise noted those conditions
apply to all the following data.

Human Body

Series Resistance

R1

1500

Ohm

Storage Capacitance

C

100

pF

Number of Pulse per pin
positive
negative

-

-

3
3

Machine

Series Resistance

R1

0

Ohm

Storage Capacitance

C

200

pF

Number of Pulse per pin
positive
negative

-

-

3
3

Latch-up

Minimum input voltage limit

-2.5

V

Maximum input voltage limit

7.5

V

1

C

Human Body Model (HBM)

V

HBM

2000

-

V

2

C

Machine Model (MM)

V

MM

200

-

V

3

C

Charge Device Model (CDM)

V

CDM

500

-

V

4

C

Latch-up Current at 125

°

C

positive
negative

I

LAT

+100

-100

-

mA

5

C

Latch-up Current at 27

°

C

positive
negative

I

LAT

+200

-200

-

mA