Agilent Technologies 20ET ユーザーズマニュアル
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Making Measurements
Using Test Sequencing to Test a Device
The following sequences will be created:
SEQUENCE SEQ1
Start of Sequence
CENTER
134 M/u
SPAN
50 M/u
DO SEQUENCE
SEQUENCE 2
SEQUENCE SEQ2
Start of Sequence
Trans:FWD S21 (B/R)
LOG MAG
SCALE/DIV
AUTO SCALE
You can extend this process of calling the next sequence from the last line of the present
sequence to 6 internal sequences, or an unlimited number of externally stored
sequences.
sequence to 6 internal sequences, or an unlimited number of externally stored
sequences.
2. To run both sequences, press:
Loop Counter Example Sequence
This example shows you the basic steps necessary for constructing a looping structure
within a test sequence. A typical application of this loop counter structure is for repeating
a specific measurement as you step through a series of CW frequencies or dc bias levels.
For an example application, see
within a test sequence. A typical application of this loop counter structure is for repeating
a specific measurement as you step through a series of CW frequencies or dc bias levels.
For an example application, see
1. To create a sequence that will set the initial value of the loop counter, and call the
sequence that you want to repeat, press:
This will create a displayed list as shown:
SEQUENCE LOOP 1
Start of Sequence
LOOP COUNTER
10x1
DO SEQUENCE
SEQUENCE 2
Preset
SEQUENCE 1 SEQ1
Seq
NEW SEQ/MODIFY SEQ SEQUENCE 1 SEQ1
SPECIAL FUNCTIONS DECISION MAKING
LOOP COUNTER
10
x1
Seq
DO SEQUENCE SEQUENCE 2
DONE SEQ MODIFY